Study the effect of type of substrates on the microstructure and optical properties of CdTe Thin Films

Hakeem, A.M. Abdel; Ali, H.M.; El-Raheem, M. M. Abd; Hasaneen, M.F.

doi:10.1016/j.ijleo.2020.165390

Cited by 13 publications

(3 citation statements)

References 37 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Thin CdTe [15] films were deposited on silicon (Si, 100), gold (Au), and AuAg alloy (Au 25 Ag 75 , wt.%) substrates through thermal evaporation deposition at room temperature [16]. Au and AuAg substrates were obtained by using a magnetron sputtering instrument on silicon wafers with a chromium layer for buffering at room temperature.…”

Section: Methodsmentioning

confidence: 99%

Enhancement of Terahertz Radiation by Surface Plasmons Based on CdTe Thin Films

Kong

Huang

et al. 2022

Nanomaterials

View full text Add to dashboard Cite

Terahertz (THz) time-domain spectroscopy (TDS) is a powerful tool used to characterize the surface/interface of materials, and semiconductor/metal interfaces can generate THz emission through ultrafast optical excitation, which can be further improved through the optical excitation of surface plasmons. Here, we assembled cadmium telluride (CdTe) on an AuAg alloy (Au25Ag75, wt.%) substrate and obtained five times stronger THz emission compared with silicon substrate, and found that the enhancement can be tuned by controlling the thickness of the semiconductor materials and plasmonic metal substrates. We believe that our results not only promote the development of THz emission enhancement, but also provide a straightforward way of producing small, thin, and more efficient terahertz photonic devices.

show abstract

Section: Methodsmentioning

confidence: 99%

Enhancement of Terahertz Radiation by Surface Plasmons Based on CdTe Thin Films

Kong

Huang

et al. 2022

Nanomaterials

View full text Add to dashboard Cite

show abstract

“…The x-ray parameters using full width at half maximum (FWHM) data, namely crystallite size (D), dislocation density (d), and microstrain ( ) e are calculated using the following expressions [39] ( )…”

Section: Microstructural Analysismentioning

confidence: 99%

“…D is the crystallite size, λ is the wavelength of the applied x-ray source, β is the reflection width, and θ is the Bragg angle [39].…”

Section: Microstructural Analysismentioning

confidence: 99%

Modeling of thermal studies on melt quenched Ge₁₈Bi₄Se₇₈ chalcogenide

Hakeem¹,

El-Raheem²,

Wakkad³

et al. 2021

Phys. Scr.

View full text Add to dashboard Cite

The crystallization characteristics for Ge18Bi4Se78 glass are studied in this work by means of differential thermal analysis (DTA) under non-isothermal conditions. One stage endothermic glass transition and one exothermic crystallization are observed in the DTA curves. The results of topological constraints for Ge18Bi4Se78 glass show that the calculated value of glass transition temperature (Tg) is very close to that of the experimental results. The as-prepared, as well as the annealed samples, are examined using x-ray diffraction (XRD), energy dispersive x-ray spectroscopy (EDX), scan electron microscope (SEM) techniques. Avrami’s exponent (n) found to have an average value of 1.61 ± 0.2 reveals a mixture of one dimensional and surface nucleation stages of growth. Many models are used to estimate the activation energies for glass transition (Eg) and crystallization (Ec). The crystallization process was found to be described by the Sestak- Berggren SB(M, N) model.

show abstract