2013 13th IEEE International Conference on Nanotechnology (IEEE-NANO 2013) 2013
DOI: 10.1109/nano.2013.6720848
|View full text |Cite
|
Sign up to set email alerts
|

Study on the optimal distribution of redundancy effort in cross-layer reliable architectures

Abstract: This paper presents a comprehensive approach to the smart application of redundancy techniques in multiple-layer hierarchical systems. Computing systems today are rapidly evolving into increasingly complex structures with an ever-increasing number of components. Moreover, future technology generations are expected to have associated lower levels of quality. For these reasons, it is emerging nowadays a renewed interest in the development of reliable architectures. In this work we delve into this topic putting s… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Publication Types

Select...

Relationship

0
0

Authors

Journals

citations
Cited by 0 publications
references
References 7 publications
0
0
0
Order By: Relevance

No citations

Set email alert for when this publication receives citations?