2008
DOI: 10.1063/1.2836681
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Study on the magnetization reversal process in a magnetic nanowire and a magnetic dot observed by magnetic field sweeping magnetic force microscopy measurements (invited)

Abstract: We have studied the details of the magnetization reversal process in Ni–Fe nanowires and dots using magnetic field sweeping (MFS)-magnetic force microscopy (MFM). All the points within the nanowire and the dot show important changes in phase (changes in stray field) including a hysteresis loop, a decrease and an increase in phase, as the magnetic field is varied. From these results, it is demonstrated that domain wall motion dominates the magnetization reversal process of a 10-nm-thick Ni–Fe nanowire with widt… Show more

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Cited by 14 publications
(16 citation statements)
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“…Furthermore, in order to verify the effect on the dipole-dipole interaction between the adjacent dots in the 10-nm-thick Ni-Fe elliptical dot arrays with different distance, we investigated the details of the magnetization process in these dots using MFS-MFM, which can directly observe the precise magnetic state in an interest point within a single dot or a single nanowire at room temperature [9], [10]. Fig.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…Furthermore, in order to verify the effect on the dipole-dipole interaction between the adjacent dots in the 10-nm-thick Ni-Fe elliptical dot arrays with different distance, we investigated the details of the magnetization process in these dots using MFS-MFM, which can directly observe the precise magnetic state in an interest point within a single dot or a single nanowire at room temperature [9], [10]. Fig.…”
Section: Resultsmentioning
confidence: 99%
“…Additionally, the effect on the dipole-dipole interaction between the adjacent dots was measured by our proposed measurement method, namely, 'magnetic field sweeping (MFS)-MFM' [9], [10]. The detail of MFS-MFM was described in [9], [10]. Fig.…”
Section: Introductionmentioning
confidence: 99%
“…Recently, we have proposed a new magnetization measurement method, the magnetic field sweeping (MFS)-magnetic force microscopy (MFM) [9]- [11], which uses an MFM tip as a detector while the magnetic filed is swept. In MFS-MFM, the precise magnetic state of a local point in a single magnetic dot or a single magnetic nanowire can be directly observed at room temperature within one minute.…”
Section: Introductionmentioning
confidence: 99%
“…In MFS-MFM, the precise magnetic state of a local point in a single magnetic dot or a single magnetic nanowire can be directly observed at room temperature within one minute. Until now, we have successfully applied MFS-MFM to study the detailed magnetization reversal in a circular dot and the effect on the dipole-dipole interaction between the adjacent elliptical dots [9], [11]. We have also observed the domain wall trapping in an Ni constrictive structure and found the dominant contribution to the magnetization reversal process in an Ni-Fe nanowire with various thicknesses and sizes [10], [11].…”
Section: Introductionmentioning
confidence: 99%
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