Study on the Al–P3HT:PCBM interfaces in electrical stressed polymer solar cell by X-ray photoelectron spectroscopy

Pei, Zingway; Devi, B. Parvathy; Subramani, Thiyagu

doi:10.1016/j.solmat.2013.12.003

Cited by 8 publications

(9 citation statements)

References 44 publications

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“…This interface overlap is usually achieved through the diffusing of Al electrode into the P3HT:PC 61 BM active layer. Interface grain size and morphology were correlated with the performance. , …”

Section: Photovoltaic Propertiesmentioning

confidence: 99%

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Interface Electrode Morphology Effect on Carrier Concentration and Trap Defect Density in an Organic Photovoltaic Device

Kesavan

Rao

Ramamurthy

2017

ACS Appl. Mater. Interfaces

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Formation of Schottky barrier contact (SBC) leads reconstruction of charges at the metal/semiconductor (MS) interface because of the wave function overlap between semiconductor and metal contact. Not only is the Schottky barrier contact formation a signature of the material's work function, but also it is sensitive to the interface trap states, the crystal orientation of the interacting materials, and other interface properties. In this work, the effect of aluminum cathode morphology on the polymer Schottky diode and bulk heterojunction (BHJ) photovoltaic device performance is studied. The electron collecting contacts in Schottky diode and BHJ device have been deposited using aluminum in pellet and nanoparticle forms. Devices fabricated by using Al nanoparticle showed improvement in dark as well as photocurrent density. Significant enhancement in J leads to overall improved power conversion efficiency. Enhanced performance in Schottky structured diode and OPV device have been correlated with electrode microstructure and its interface properties such as improved electrically active contact and enhanced charge transport. Electrical conductivity is discussed based on enhanced electrical coherence across organic semiconductor and electrode interface. Therefore, the contribution of electrical enhancement leads to improvement in short-circuit current density (J) in BHJ solar cell which is due to reduced trap density. Further, PCE was correlated with the density of interface trap states studied by drive level capacitance profiling technique.

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Section: Photovoltaic Propertiesmentioning

confidence: 99%

“…Interface grain size and morphology were correlated with the performance. 13,14 5.2. Photovoltaic Characteristics.…”

Section: Photovoltaic Propertiesmentioning

confidence: 99%

Interface Electrode Morphology Effect on Carrier Concentration and Trap Defect Density in an Organic Photovoltaic Device

Kesavan

Rao

Ramamurthy

2017

ACS Appl. Mater. Interfaces

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“…The PCBM segregation toward the top metal electrode has been previously reported in P3HT:PCBM blends by different techniques: 18 XPS surface analysis was applied af ter delaminating the top electrode to measure the intensity of the S 2p peak, from thiophene, at the surface of the active layer; thermal annealing was shown to be associated with a considerable lowering of the sulfur signal, that is, a top segregation of PCBM. 19 More recently, XPS depth profiling of the Al/ P3HT:PCBM interface revealed the presence of three chemical components (doublets) corresponding to Al 2 O 3 , Al−O−C, and Al−Al chemical environments. 20,21 Furthermore, the effect of thermal annealing on the vertical distribution of P3HT and PCBM was recently studied by depth profiling spin-coated layers (without top electrode) with Ar cluster ion beam.…”

Section: Introductionmentioning

confidence: 99%

Chemical Analysis of the Interface in Bulk-Heterojunction Solar Cells by X-ray Photoelectron Spectroscopy Depth Profiling

Busby

List‐Kratochvil

Pireaux

2017

ACS Appl. Mater. Interfaces

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Despite the wide use of blends combining an organic p-type polymer and molecular fullerene-based electron acceptor, the proper characterization of such bulk heterojunction materials is still challenging. To highlight structure-to-function relations and improve the device performance, advanced tools and strategies need to be developed to characterize composition and interfaces with sufficient accuracy. In this work, high-resolution X-ray photoelectron spectroscopy (XPS) is combined with very low energy argon ion beam sputtering to perform a nondestructive depth profile chemical analysis on full Al/P3HT:PCBM/PEDOT:PSS/ITO (P3HT, poly(3-hexylthiophene); PCBM, [6,6]-phenyl-C-butyric acid methyl ester; PEDOT, poly(3,4-ethylenedioxythiophene; PSS, polystyrenesulfonate; ITO, indium tin oxide) bulk-heterojunction solar cell device stacks. Key information, such as P3HT and PCBM composition profiles and Al-PCBM chemical bonding, are deduced in this basic device structure. The interface chemical analysis allows us to evidence, with unprecedented accuracy, the inhomogeneous distribution of PCBM, characterized by a strong segregation toward the top metal electrode. The chemical analysis high-resolution spectra allows us to reconstruct P3HT/PCBM ratio through the active layer depth and correlate with the device deposition protocol and performance. Results evidence an inhomogeneous P3HT/PCBM ratio and poorly controllable PCBM migration, which possibly explains the limited light-to-power conversion efficiency in this basic device structure. The work illustrates the high potential of XPS depth profile analysis for studying such organic/inorganic device stacks.

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“…Poly(3,4-ethylene dioxythiophene):(polystyrene sulfonic acid) (PEDOT:PSS) is generally used as hole transport layer (HTL) [5,6] in the conventional structure OPV. However, the acidity of PEDOT:PSS may cause the corrosion of indium tin oxide (ITO) and lead to diffusion of In and Sn atoms [7].…”

Section: Introductionmentioning

confidence: 99%

Band offset of vanadium-doped molybdenum oxide hole transport layer in organic photovoltaics

Chang

Huang

Jeng

et al. 2016

Solid-State Electronics

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Study on the Al–P3HT:PCBM interfaces in electrical stressed polymer solar cell by X-ray photoelectron spectroscopy

Cited by 8 publications

References 44 publications

Interface Electrode Morphology Effect on Carrier Concentration and Trap Defect Density in an Organic Photovoltaic Device

Interface Electrode Morphology Effect on Carrier Concentration and Trap Defect Density in an Organic Photovoltaic Device

Chemical Analysis of the Interface in Bulk-Heterojunction Solar Cells by X-ray Photoelectron Spectroscopy Depth Profiling

Band offset of vanadium-doped molybdenum oxide hole transport layer in organic photovoltaics

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