2015
DOI: 10.1016/j.surfcoat.2015.10.037
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Study on morphological and structural properties of silver plating on laser etched silicon

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Cited by 24 publications
(9 citation statements)
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“…Bruggeman's effective medium approximation (BEMA) is used to calculate the refractive index of the PSi layer (n Psi ) filled air as following [34,65,66]:…”
Section: Refractive Index Of Porous Silicon N Psimentioning
confidence: 99%
“…Bruggeman's effective medium approximation (BEMA) is used to calculate the refractive index of the PSi layer (n Psi ) filled air as following [34,65,66]:…”
Section: Refractive Index Of Porous Silicon N Psimentioning
confidence: 99%
“…On the contrary, by increasing the temperature, the refractive index of Si increases at a constant wavelength. Bruggeman's effective medium approximation (BEMA) is used to calculate the refractive index of the PSi layer (n Psi ) filled air as following [34,65,66]:…”
Section: Refractive Index Of Porous Siliconmentioning
confidence: 99%
“…The refractive index of Silicon (n Si ) in the ranges 1.2 to 14 μm and 20-1600 K is calculated as [63,64]: Bruggeman's effective medium approximation (BEMA) is used to calculate the refractive index of the PSi layer (n Psi ) filled air as following [34,65,66]:…”
Section: Refractive Index Of Porous Siliconmentioning
confidence: 99%
“…were noticed at the 37.8°and 44°corresponding to 111 and 200 planes, respectively. The nanocrystallite sizes of gold were calculated from the peak broadening as shown in and can be obtained by using Scherer's formula as follows [13]:…”
Section: Characterizationmentioning
confidence: 99%