Study of the Wurtzite-Type Binary Compounds. I. Structures of Aluminum Nitride and Beryllium Oxide

Abstract

T~ec/~ ratios of the hexagonal AIN an~ BeO structures show that they do not have a regularly tetrahedral dlstnbutIOn of bonds. The structural details have been studied by x-ray analysis and are discussed in relation ~o the concepts. of t~e electronegati~ity and ~Iectroneutrality of atoms. This gives a basis for an understand-Ing of the dlstnbutIOn of the wurtzlte and ZInC blende lattices in the binary compounds of the group III/V and II/VI elements.

PEALD AlN: Controlling growth and film crystallinity

“…This suggests that the material is polycrystalline and exhibits the signature of hexagonal (wurtzitic) crystalline planes (crosschecked with powder diffraction data for hexagonal AlN [30]). Compared to the peak intensities reported in [30], we see a stronger peak at a 2θ of 35.8 o in our sample, which may be due to a greater number of hexagonal (0002) planes grown along that particular tilt angle, which was probed with GIXRD with 2 o angle of incidence. Crystallite domain sizes were also calculated from the GIXRD scan, using Scherrer equation.…”

“…The distribution of the (10 10) , (0002) and (10 11) planes (which are the three most abundant planes found in powder AlN [30]), for a range of out-of-plane tilt angles (δ), was checked by performing omega scans of these peaks, within the limits of the diffractometer (Fig. 8).…”

Rietveld-refinement study of aluminium and gallium nitrides

“…[4]). The existing experimental data ( [4][5][6][7][8][9][10][11][12][13][14][15][16][17][18][19][20] for AlN, [4,[21][22][23][24][25][26][27][28][29][30][31] for GaN) include mainly the lattice parameters determined by powder diffraction. The (generally small) discrepancies among experimental lattice parameters reported by various authors reflect the variations attributable to differences between the samples (monocrystals, powders with varying level of impurities and defects, more or less strained thin layers).…”

Unit cell structure of the wurtzite phase of GaP nanowires: X-ray diffraction studies and density functional theory calculations

“…16 In this work we report on the determination of the detailed crystal structure of GaP WZ nanowires by synchrotron x-ray diffraction (XRD). So far such measurements of the internal structure of similar compounds were mostly done on powders using the Rietveld method 2,18 or bulk crystals [19][20][21] or deduced from theoretical calculations. 8,21,22 We use highly intense synchrotron radiation to enable the measurement also on the nanometer-sized crystallites of an ensemble of GaP nanowires.…”