Study of the Radiation-Hardness of VCSEL/PIN

Gan, K. K.

doi:10.22323/1.098.0041

Cited by 3 publications

(4 citation statements)

References 3 publications

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“…The optical receiver used for this SEU study consists of an 8channel PiNarray photodiode connected to the DORIC chip. In order to evaluate new optical components [7], the standard Si PiNdiode array used in ATLAS pixel detector [1] was replaced by a new generation opto package [8] with a fast GaAs PiNdiode array [9]. The modified receiver is a prototype for the optolink design for the future ATLAS pixel innerblayer (IBL) project.…”

Section: Experimental Setup For Timeresolved Singleeventupset Measurementioning

confidence: 99%

Time resolved studies of Single Event Upset in optical data receiver for the ATLAS pixel detector

Ziolkowski¹

2010

Proceedings of 9th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors — PoS

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A multichannel optical transceiver (optoboard) housing a PiN array coupled to a BPM signal decoding ASIC, was exposed to a proton beam of 24 GeV/c momentum. The 40 MHz clock and 40 Mbit/s data supplied to the optoboard were restored directly on the board and then in addition transmitted back to the counting room for online checking of consistency. In the case of a data bit error or a missing clock transition, indicating an occurrence of a SEU, a sequence of time aligned data bits along with the corresponding clock states were recorded for offline analyses. A compact DAQ system based on a FPGA processor was customdeveloped for this task. Measurements were performed for input signals covering a certain range of optical power. We present results obtained from the August 2009 run at the CERN irradiation facility, including the SEU occurrence rate and crosssection, both as a function of the input optical amplitude, along with the timeresolved structure of the SEU incidents. 9th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor

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Section: Experimental Setup For Timeresolved Singleeventupset Measurementioning

confidence: 99%

Time resolved studies of Single Event Upset in optical data receiver for the ATLAS pixel detector

Ziolkowski¹

2010

Proceedings of 9th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors — PoS

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“…First, the VCSEL arrays were found to fail under moderate humidity and a suitable replacement had to be found. We measured the radiation hardness [3] and robustness (e.g. humidity resistance) of several commercial VCSEL arrays and chose an array manufactured by Finisar [4].…”

Section: The New Pixel Opto-boardsmentioning

confidence: 99%

The new radiation-hard optical links for the ATLAS pixel detector

Kass¹,

Gan²,

Kagan³

et al. 2013

Preprint

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“…In the past few years, we irradiated VCSEL and PIN diodes in several rounds with smaller statistics using 24 GeV protons [1]. Based on that study, in 2009, 7 VCSEL arrays manufactured by Finisar and 20 PIN arrays manufactured by Optowell were irradiated with protons.…”

Section: Introductionmentioning

confidence: 99%

“…In 2010, twelve VCSEL arrays manufactured by Finisar and twenty PIN arrays manufactured by ULM were irradiated with protons and one VCSEL and two PIN arrays were irradiated with 300 MeV pions. We concentrate here the irradiation of arrays 1 . Each array has a common cathode and contains 12 channels.…”

Section: Introductionmentioning

confidence: 99%