Study of the phases of iron–nitride with a stoichiometry near to FeN

Andrzejewska, Ewa; González-Arrabal, R.; Borsa, D.M.; Boerma, D.O.

doi:10.1016/j.nimb.2006.03.150

Cited by 31 publications

(33 citation statements)

References 8 publications

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“…The enhancement of the nitrogen signal between S4 and S5 samples is clear. A quantitative analysis of the different spectra using the scattering cross sections reported by Feng et al [10] for the 14 N(α, α) 14 N reaction considering the appropriate corrections for the protons from the reaction 14 N(α, p) 17 O, which contribute to the N signal, [7,10] leads to the following average composition for the respective samples, i.e. Table 1).…”

Section: Resultsmentioning

confidence: 99%

“…[12]. We have used resonant RBS [7,10] to determine the average composition of the films, with an accuracy better than 5%, by using an incident beam of 3.7 MeV 4 He + ions and detecting the backscattered ions at scattering angles of 165…”

Section: Methodsmentioning

confidence: 99%

“…The distribution and quantification of the elements was determined by simulation (i.e. SIMNRA program) using the 14 N(α, α) 14 N elastic-scattering cross sections, as reported by Feng et al, [10] and taking into account the background of protons from the reaction 14 N(α, p) 17 O contributing to the N signal, as determined by Andrzejewska et al [7] and Feng et al [10] The structure of the different films was analyzed by XRD at a grazing incidence of 1…”

Section: Methodsmentioning

confidence: 99%

“…In the present paper, we have fabricated new samples and extended the range of nitrogen content to reach the γ and γ phases. In this case, we have performed resonant RBS [7,10] to enhance the nitrogen signal and to obtain a reliable quantitative analysis of the nitrogen content in the film. In addition, we have used the advantages of Mössbauer spectroscopy in combination with XRD to improve the distinction between different phases present in the films.…”

Section: Introductionmentioning

confidence: 99%

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Synthesis and characterization of iron nitrides. An XRD, Mössbauer, RBS and XPS characterization

Prieto

Marco

Sanz

2008

Surface & Interface Analysis

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In this work, we demonstrate the capability of a dual ion beam sputtering method to obtain iron nitride thin films, FeN x , in a wide composition range (0.1 < x < 0.5) and structures (α , γ , ε, ζ , γ and γ ) by controlling the deposition conditions (i.e. deposition rate, flux and energy of the assisting nitrogen ions and substrate temperature). The average composition of the films has been determined by resonant RBS to enhance the nitrogen signal, whereas the structural characterization and the phase identification have been carried out by X-ray diffraction (XRD) and Mössbauer spectroscopy. We present a thorough and complementary analysis of the XRD and Mössbauer data as a function of the composition of the film for all the iron nitride phases. Furthermore, it is shown that the iron Auger parameter (AP) increases up to 0.8 eV with respect to that for pure α-Fe when the nitrogen concentration increases up to 46 at.% (i.e. γ and γ phases) so that it might serve to analyze samples of unknown composition.

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Section: Resultsmentioning

confidence: 99%

Section: Methodsmentioning

confidence: 99%

Section: Methodsmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Synthesis and characterization of iron nitrides. An XRD, Mössbauer, RBS and XPS characterization

Prieto

Marco

Sanz

2008

Surface & Interface Analysis

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“…More details about the determination of the nitrogen concentration are described elsewhere. 6,26 Since in both, RBS and non-RBS spectra, the peak associated to nitrogen is mounted on a high background related to the substrate, NRA experiments, using the nuclear reaction 14 N͑d,␣͒ 12 C, 27 were carried out in order to determine the nitrogen concentration in a more accurate way. The experiments were performed at the Institute of Ion Beam Physics and Materials Research ͑FZD͒, using a D + beam at an energy of 1.80 MeV and an implanted Si detector located at 150°to the beam direction.…”

Section: Methodsmentioning

confidence: 99%

Thermal stability of copper nitride thin films: The role of nitrogen migration

González-Arrabal

Gordillo

Martín‐González³

et al. 2010

Journal of Applied Physics

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The atomic composition, structural, morphological, and optical properties of N-rich copper nitride thin films have been investigated prior to and after annealing them in vacuum at temperatures up to 300°C. Films were characterized by means of ion-beam analysis ͑IBMA͒, X-ray diffraction ͑XRD͒, atomic force microscopy ͑AFM͒, and spectroscopic ellipsometry techniques ͑SE͒. The data reveal that even when the total ͑integrated over the whole thickness͒ atomic composition of the films remains constant, nitrogen starts to migrate from the bulk to the film surface, without out-diffusing, at temperatures as low as 100°C. This migration leads to two chemical phases with different atomic concentration of nitrogen, lattice parameters, and crystallographic orientation but with the same crystal structure. XRD experimental and Rietveld refined data seem to confirm that nitrogen excess accommodates in interstitial locations within the anti-ReO 3 crystal lattice forming a solid solution. The influence of nitrogen migration on the optical ͑electronic͒ properties of the films will be discussed.

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Eine NiAs‐artige Hochdruckmodifikation von FeN

et al. 2017

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Durch Kombination von Laser‐geheizten Diamantstempelzellen mit Synchrotron‐Mößbauer‐Spektroskopie wurden die chemischen Hochtemperatur‐Hochdruck‐Reaktionen von Eisen und Eisennitrid, Fe2N, mit Stickstoff untersucht. Nach Erhitzen bei 1300 K bei Drücken über 10 GPa zeigte deutliche magnetische Hyperfeinaufspaltung die Bildung einer neuen Verbindung an. Anschließende röntgenographische In‐situ‐Analysen ergaben eine neue FeN‐Modifikation im NiAs‐Strukturtyp, deren Gesamtenergie und Bindungssituation über quantenchemische Methoden bestimmt wurden.

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Study of the phases of iron–nitride with a stoichiometry near to FeN

Cited by 31 publications

References 8 publications

Synthesis and characterization of iron nitrides. An XRD, Mössbauer, RBS and XPS characterization

Synthesis and characterization of iron nitrides. An XRD, Mössbauer, RBS and XPS characterization

Thermal stability of copper nitride thin films: The role of nitrogen migration

Eine NiAs‐artige Hochdruckmodifikation von FeN

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