Study of the influence of adsorbed water on AFM friction measurements on molybdenum trioxide thin films

Gulbiński, W.; Pailharey, D.; Suszko, T.; Mathey, Y.

doi:10.1016/s0039-6028(00)01101-8

Cited by 30 publications

(13 citation statements)

References 14 publications

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“…Often quite different dependencies of adhesion force on humidity are reported for the same system, e.g. for mica [700,706,707], and the increase of adhesion with humidity is either reported to be step-like [694,700], linearly increasing [686,708] or exhibiting a maximum at intermediate values [707,684]. These discrepancies need clarification.…”

Section: Meniscus Forcementioning

confidence: 98%

Force measurements with the atomic force microscope: Technique, interpretation and applications

Butt

Cappella

Kappl

2005

Surface Science Reports

3,193

2,949

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Section: Meniscus Forcementioning

confidence: 98%

Force measurements with the atomic force microscope: Technique, interpretation and applications

Butt

Cappella

Kappl

2005

Surface Science Reports

3,193

2,949

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“…Many experiments showed a significant dependency of the adhesion force on the relative humidity [40,52,54,56,57,183]. A continuous increase humidity was, for example, observed for the interaction of a silicon nitride tip with mica [194], between silica particles [199], a silica particle and a silicon wafer [200], or between a silicon nitride tip and molybdenum trioxide [201]. The adhesion force between particles or particle surface by using AFM colloidal probe technique depending on relative humidity [190,202,203].…”

Section: Influence Of Humidity On Adhesionmentioning

confidence: 99%

“…Some results of our experiment showed that the magnitude of the adhesion forces changes on mica and quartz surfaces and observed that maximum of adhesion forces at relative humilities around 20% or less 45%. Results of other studies showed that meniscus force between silica particles [62,63], a silica particle and a silicon wafer [64], between a silicon nitride tip and molybdenum trioxide [65], or pharmaceutical substances [66], and between silicon wafer and silicon nitride tip was at relative humidity around 70% [67]. In other cases adhesion force-versus-humidity curves showed a maximum [42,58,68], or a step-like increase [69].…”

Section: Introductionmentioning

confidence: 99%

On the Adhesion between Fine Particles and Nanocontacts: An Atomic Force Microscope Study

et al. 2006

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To optimize the handling of fine powders in industrial applications, understanding the interaction forces between single powder particles is fundamental. The forces between colloidal particles dominate the behavior of a great variety of materials, including paints, paper, soil, and many industrial processes. With the invention of the atomic force microscope (AFM), the direct measurement of the interaction between single micron-sized particles became possible. The adhesional contact between a particle and a substrate is a parameter for analyzing pull-off force data generated by AFM. The aim of this study was to understand surface interactions between fine particles. I measured the adhesion forces between AFM tips or particles attached to AFM cantilevers and different solid samples. Smooth and homogeneous surfaces such as silicon wafer, mica, or highly oriented pyrolytic graphite (HOPG), and more rough and heterogeneous surfaces such as iron particles or patterns of TiO 2 nanoparticles on silicon wafer were used. First, I addressed to the wellknown issue that AFM adhesion experiment results show wide distributions of adhesion forces rather than a single value. My experimental results show that variations in adhesion forces comprise fast (i.e., from one force curves to the next) random fluctuations and slower fluctuations, which occur over tens or hundreds of consecutive measurements. Slow fluctuations are not likely to be the result of variations in external factors such as lateral position, temperature, humidity, and so forth because those were kept constant. Even if two solid bodies are brought into contact under precisely the same conditions (same place, load, direction, etc.) the result of such a measurement will often not be the same as for the previous contact. The measurement itself will induce structural changes in the contact region which can change the value for the next adhesion force measurement.In the second part I studied the influence of humidity on the adhesion of nanocontacts. Humidity was adjusted relatively fast to minimize tip wear during one experiment. For hydrophobic surfaces, no signification change of adhesion force with humidity was observed. Adhesion force-versus-humidity curves recorded with hydrophilic surfaces either showed a maximum or continuously increased. I demonstrate that the results can be interpreted with simple continuum theory of the meniscus force. The meniscus force is calculated based on a model that includes surface roughness and takes into account different AFM tip (or particle) shapes by a two-sphere-model.Experimental and theoretical results show that the precise contact geometry has a critical influence on the humidity dependence of the adhesion force.Changes of tip geometry on the sub-10-nm length scale can completely change adhesion force-versus-humidity curves. Our model can also explain the differences between earlier AFM studies, where different dependencies of the adhesion force on humidity were observed.Keywords: Atomic force microscopy (AFM), cantile...

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“…20,23 The scan direction was perpendicular to the long axis of the cantilever to allow maximal lateral displacement for enhanced sensitivity. The thickness of the polymer blend was measured by introducing a small scratch on the surface and acquiring a contact mode AFM image at the stepedge (Fig.…”

mentioning

confidence: 99%

Friction coefficient mapping using the atomic force microscope

Breakspear

Smith

Nevell

et al. 2004

Surface & Interface Analysis

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A friction coefficient map of the surface of an immiscible polymer blend has been constructed using data obtained with the atomic force microscope. Spatially resolved friction coefficients, obtained from gradients of linear plots of frictional force versus applied load, were used to construct the map, with corresponding frictional forces being derived from lateral force data and the lateral spring constant. Values of the friction coefficient were confirmed using an Si 3 N 4 /Si 3 N 4 couple, for which literature values were available. Excellent agreement with the literature was observed through the use of this method.

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Study of the influence of adsorbed water on AFM friction measurements on molybdenum trioxide thin films

Cited by 30 publications

References 14 publications

Force measurements with the atomic force microscope: Technique, interpretation and applications

Force measurements with the atomic force microscope: Technique, interpretation and applications

On the Adhesion between Fine Particles and Nanocontacts: An Atomic Force Microscope Study

Friction coefficient mapping using the atomic force microscope

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