2019
DOI: 10.1007/s00339-019-2893-1
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Study of the effects of both film thickness and annealing time on CuxSyOz thin films for the possibility of usage as solar control coatings

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Cited by 10 publications
(3 citation statements)
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“…It is also confirmed from these images that the uniformity of films improves with increase in thickness. The change in morphology with thickness is also observed in Cu x S y O z thin film [32].…”
Section: Morphological Studymentioning
confidence: 58%
“…It is also confirmed from these images that the uniformity of films improves with increase in thickness. The change in morphology with thickness is also observed in Cu x S y O z thin film [32].…”
Section: Morphological Studymentioning
confidence: 58%
“…It suggests that at least for Cu, films deposited from NWs have higher thermal stability than magnetron-deposited films. Note that the film stability depends not only on the annealing temperature, but also on the film thickness: compared magnetron deposited Cu film was 112 nm thick, and Cu NWs film has apparent thickness 110 nm; for films of different thickness stability results can differ [26].…”
Section: Resultsmentioning
confidence: 99%
“…A possible scheme for the growth mechanism of CuS/TeO 2 NWs is shown in figures 5(a)-(c). During the first heating steps some parts of CuS layer surface may form islands (irregular droplets) and may be subject of oxidation and sulfur removal [24,33,34]. The droplets are able to capture the Te and O volatiles transported by the Ar flux, forming an eutectic alloy.…”
Section: Resultsmentioning
confidence: 99%