2014
DOI: 10.1109/tie.2013.2293695
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Study of Supercapacitor Aging and Lifetime Estimation According to Voltage, Temperature, and RMS Current

Abstract: Due to its capacity to store or supply energy with high power, the supercapacitor is becoming an attractive component. Because of the electrostatic nature of energy storage, the endurance of this component toward repetitive charge and discharge cycles is relatively high. The goal of this paper is to demonstrate that the cycling has an impact on the degradation of the supercapacitor and as a result on its lifetime. Based on accelerated cycling tests, some supercapacitors were studied using a dedicated test benc… Show more

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Cited by 158 publications
(89 citation statements)
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“…Apart from the average temperature, other features of the current profile (e.g., pulse duration and rest period) also influence aging characteristics. Shorter pulse durations of higher charge/discharge rates lead to faster expansion/contraction of the electrode due to ion insertion/deinsertion in the electrode [112][113][114]. This alternate expansion/contraction causes mechanical stresses in the electrode that accelerate aging.…”
Section: Aging Testsmentioning
confidence: 99%
“…Apart from the average temperature, other features of the current profile (e.g., pulse duration and rest period) also influence aging characteristics. Shorter pulse durations of higher charge/discharge rates lead to faster expansion/contraction of the electrode due to ion insertion/deinsertion in the electrode [112][113][114]. This alternate expansion/contraction causes mechanical stresses in the electrode that accelerate aging.…”
Section: Aging Testsmentioning
confidence: 99%
“…When one ageing acceleration factor, SoC, is variable over time, the parameter identification of [20,21] and batteries [17,22].…”
mentioning
confidence: 99%
“…5 In order to mitigate/eliminate this bias, we Table 2 we can see that the inferred value of the C PC1 is of 302.6 F. Also this value can be considered reasonable since is lower than the corresponding one after a LE test (it has been already underlined that during a PC stress test the ageing phenomena are amplified compared to those during a LE stress test). 5 Further details concerning this aspect can be found in [16].…”
Section: General Overviewmentioning
confidence: 88%
“…Refs. [1][2][3][4][5] have discussed the use of the SOH of these devices for predicting the remaining lifetime and to define optimal energy management strategies.…”
Section: Introductionmentioning
confidence: 99%