2008
DOI: 10.1063/1.2884264
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Study of residual background carriers in midinfrared InAs∕GaSb superlattices for uncooled detector operation

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Cited by 45 publications
(28 citation statements)
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References 19 publications
(20 reference statements)
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“…To achieve sufficient light absorption, small leakage current and fast response simultaneously, devices with a thickness of B300 nm are found to be optimal. Devices with an active area of 0.1 and 0.01 cm 2 were measured. Figure 5a shows the transient photocurrents of the devices measured under 0 bias at a light intensity of B10 mW cm À 2 and at a pulse frequency of 100 kHz (photoresponse of the silicon diode is shown for comparison).…”
Section: Resultsmentioning
confidence: 99%
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“…To achieve sufficient light absorption, small leakage current and fast response simultaneously, devices with a thickness of B300 nm are found to be optimal. Devices with an active area of 0.1 and 0.01 cm 2 were measured. Figure 5a shows the transient photocurrents of the devices measured under 0 bias at a light intensity of B10 mW cm À 2 and at a pulse frequency of 100 kHz (photoresponse of the silicon diode is shown for comparison).…”
Section: Resultsmentioning
confidence: 99%
“…And a built-in or applied electric field is necessary to separate the electrons and holes to produce an electric current. Various types of semiconductor materials have been applied in photodetectors, such as Si, InGaAs, ZnO, GaN, carbon nanotubes, quantum dots and conjugated polymers [1][2][3][4][5][6][7][8][9][10] . Although certain applications require different features, the key figure-of-merit parameters are responsivity (R), detectivity (D*), noise equivalent power (NEP), linear dynamic range (LDR) and response speed.…”
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confidence: 99%
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“…We select a SL structure of 47.0 Å InAs/21.5 Å Ga 0.75 In 0.25 Sb proposed by Grein et al, 2 theoretically adjusted for the greatest possible detectivity, and optimize a growth parameter for the best possible material quality. Since SL material quality is strongly related to the densities of nonradiative SRH recombination centers and the residual dopings, 9 the impact of growth temperature (T g ) on the photoresponse (PR) intensity, and the charge carrier density and mobility will be investigated using photoconductivity and temperature-dependent Hall effect measurements. The 300 K recombination lifetime of a SL sample optimized for a strong PR signal will also be investigated by time-resolved pump-probe measurements.…”
Section: =2mentioning
confidence: 99%
“…For the SLs designed for the same 80 meV gap at 40 K, the electronic band structure of either 49.7 Å InAs/57.0 Å Ga 0. 9 In 0.1 Sb or 47.0 Å InAs/21. 5 Å Ga 0.75 In 0.25 Sb SL designs computed with the interface terms had the total lifetime of either 5 Â 10 À9 or 1.4 Â 10 À7 s. This difference leads the device detectivity to be either 5.2 Â 10 13 or 6.0 Â 10 14 cmHz 1 …”
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confidence: 99%