We explore the optimum growth space for a 47.0 Å InAs/21.5 Å Ga 0.75 In 0.25 Sb superlattices (SLs) designed for the maximum Auger suppression for a very long wavelength infrared gap. Our growth process produces a consistent gap of 50 6 5 meV. However, SL quality is sensitive to the growth temperature (T g ). For the SLs grown at 390À470 C, a photoresponse signal gradually increases as T g increases from 400 to 440 C. Outside this temperature window, the SL quality deteriorates very rapidly. All SLs were n-type with mobility of $10 000 V/cm 2 and 300 K recombination lifetime of $70 ns for an optimized SL. V C 2012 American Institute of Physics.[http://dx.doi.org/10.1063/1.4764015] An alternative infrared material system proposed by Smith and Mailhiot 1 uses the concept of broken-gap type-II band alignment of the InAs/GaInSb strained layer superlattices (SLs) to achieve narrow gaps for the very long wavelength infrared (VLWIR) detection (>14 lm). By alloying indium to the GaSb layer, the lattice constant of the GaInSb layer increases. The biaxial tension in the InAs layer lowers the conduction band, while the biaxial compression in the GaInAs layer raises the heavy-hole (HH) band. As a result, the very narrow gap can be achieved without sacrificing optical absorption. In addition, an intentionally introduced strain can create a large splitting between the HH and light-hole bands in the p-type SLs; this situation can prevent the holehole Auger recombination process, therefore the Auger limited minority carrier lifetime, detectivity, and the background limited operating temperature can be significantly improved. Grein et al.2 demonstrated how a small variation in the strain splitting between the uppermost valence bands can create an order of magnitude differences on their calculated detectivities. For the SLs designed for the same 80 meV gap at 40 K, the electronic band structure of either 49.7 Å InAs/57.0 Å Ga 0.9 In 0.1 Sb or 47.0 Å InAs/21. 5 Å Ga 0.75 In 0.25 Sb SL designs computed with the interface terms had the total lifetime of either 5 Â 10 À9 or 1.4 Â 10 À7 s. This difference leads the device detectivity to be either 5.2 Â 10 13 or 6.0 Â 10 14 cmHz 1 =2 /W. Although the greater strain splitting generates the better detectivity, one has to limit the indium alloy composition below 30% due to difficulties in strain balancing above this percentage. The authors also computed device detectivity for the more realistic case of 82 meV SL detectors with a 35 ns Shockley-Read-Hall (SRH) lifetime.3 Unexpectedly, Auger processes were fast enough to overrule SRH processes and the detectors still can operate at reasonably high temperatures, roughly exceeding 150 K.3 Therefore, strained InAs/GaInSb SL system appeared to be an excellent choice for the VLWIR detection. Unfortunately, the VLWIR InAs/GInSb material growth studies are still in immature stage of development. Many crystal growers tend to believe that the existence of an alloy layer can create a higher degree of disorder caused by alloy scattering, indium segre...