Study of reliability-efficiency tradeoff of active thermal control for power electronic systems

Online Junction Temperature Estimation of SiC Power <sc>mosfets</sc> Through On-State Voltage Mapping

“…Thermal cycling magnitude strongly influences semiconductors' lifetime [14] and [15]. Experimental data showing the closed loop limitation of the junction temperature have been presented.…”

System-level lifetime-oriented power sharing control of paralleled DC/DC converters

“…One of the approaches in improving lifetime and reliability of power semiconductors is known as active thermal control for reliability [8], [14]. For instance in [3], [7] different modulation strategies have been introduced in order to reduce the thermal loss of converters.…”

“…Thermal stress reduction employing active power is further presented in [5], [6] by utilizing a storage system in the dc link of a back-to-back based wind converter. Lifetime extension employing active thermal control is introduced in [8] by adapting the switching frequency, while the system efficiency is reduced. Optimal operation of parallel converters is presented in [9] extending the lifetime while increasing the thermal stress of the components.…”

Smart Transformer reliability and efficiency through modularity

“…A possible concept for the target of high efficiency is a modular design of the ST by using power semiconductors rated for lower voltage and current [9]. In partial load operation, the control can be used to optimize the conflicting goals between high efficiency and low thermal stress for the power semiconductors, realized by active thermal control [10]. In combination with condition monitoring, stress can be loaded on components with low wear out and faults can be delayed.…”