2001
DOI: 10.1016/s0038-1101(01)00148-4
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Study of porous silicon, silicon carbide and DLC coated field emitters for pressure sensor application

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Cited by 25 publications
(9 citation statements)
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“…[187][188][189] Micro-and meso-PSi could also be used as isolation material for radio-frequency (rf) applications because of its high resistivity and compatibility with modern very-largescale-integration IC technology. 190 The list of possible applications is not yet exhausted; there are many more possible applications of porous semiconductors covered in the reviews, 4,12,27,30,32,38,153,157,171,[191][192][193][194][195][196][197] which we will not address here. This includes the many possible applications of macroporous Si, which has a few outstanding properties on its own.…”
Section: Fields Of Porous Si Applicationsmentioning
confidence: 99%
“…[187][188][189] Micro-and meso-PSi could also be used as isolation material for radio-frequency (rf) applications because of its high resistivity and compatibility with modern very-largescale-integration IC technology. 190 The list of possible applications is not yet exhausted; there are many more possible applications of porous semiconductors covered in the reviews, 4,12,27,30,32,38,153,157,171,[191][192][193][194][195][196][197] which we will not address here. This includes the many possible applications of macroporous Si, which has a few outstanding properties on its own.…”
Section: Fields Of Porous Si Applicationsmentioning
confidence: 99%
“…According to this principle, the residual gas density is estimated by the current of ions produced by ionization of the gas with an electron flow with known parameters. The usually employed heated thermionic electron source should be replaced with a cold field cathode with a nanocarbon emissive coating [1][2][3][4]. Such replacement would yield enhanced reliability, vast reduction of energy consumption and practically zero turn-on time.…”
Section: General Scheme Of the Gaugementioning
confidence: 99%
“…Presence of gas particles influence vibrations of such microelements as miniature diaphragms, springs or cantilevers, decreasing their sensitivity and changing operating frequency. Ultra high vacuum is necessary in microdevices like fieldemission electron sources, electron microscopes, and mass spectrometers [3]. In these devices sufficiently long free path of electrons or ions is a critical parameter.…”
Section: Vacuum Memsmentioning
confidence: 99%