2016
DOI: 10.1016/j.nimb.2015.09.032
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Study of In distribution on GaInSb:Al crystals by ion beam techniques

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Cited by 10 publications
(4 citation statements)
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“…Stelian and Duffar [20] simulated the effects of temperature gradient and growth rate on GaInSb crystal quality, reported that the radial and axial segregation of In were 0.626 mol% mm −1 and 0.674 mol% mm −1 , respectively. Streicher et al [21] prepared GaInSb crystals doped with a small amount of Al with VB technique. It is found that the composition uniformity of the doped ingot was higher than that of the undoped ingot.…”
Section: Introductionmentioning
confidence: 99%
“…Stelian and Duffar [20] simulated the effects of temperature gradient and growth rate on GaInSb crystal quality, reported that the radial and axial segregation of In were 0.626 mol% mm −1 and 0.674 mol% mm −1 , respectively. Streicher et al [21] prepared GaInSb crystals doped with a small amount of Al with VB technique. It is found that the composition uniformity of the doped ingot was higher than that of the undoped ingot.…”
Section: Introductionmentioning
confidence: 99%
“…Klein et al [25] prepared Tedoped Ga 1-x In x Sb crystal with the VB method, and found that Te optimized and compensated for the intrinsic acceptor defects in the crystal, making the axial distribution of In component more uniform, reducing dislocation density, and making the structure more uniform. Streicher et al [26] prepared Ga 0.8 In 0.2 Sb crystals containing Al with the VB method, the axial segregation was 2.3 mol% mm −1 . However, the impacts of Al doping on segregation, dislocation, and electrical properties were not analyzed in detail.…”
Section: Introductionmentioning
confidence: 99%
“…The calculation of the yield using equation 4would be more convenient and the sample analysis could be automated if there existed an appropriate analytical code. Several attempts have been presented in the past, with ERYA [1][2][3][4][5][6] being the most prominent candidate. Unfortunately, this code operates only in Windows 64-bit version-based computers, because it is developed in LabVIEW (National Instruments TM ), and moreover, it is not compatible with R33 differential cross section standard input files.…”
Section: Introductionmentioning
confidence: 99%