1990
DOI: 10.1051/mmm:0199000103018900
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Study of epitaxial films of Ag, Pd and AgPd deposited by dc sputtering

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“…The film structure and homogeneity were examined by transmission and reflection high-energy electron diffraction (THEED and RHEED), selected area diffraction (SAD) and transmission electron microscopy (TEM) (see Ref. 19).…”
Section: Preparation Of the Samplesmentioning
confidence: 99%
“…The film structure and homogeneity were examined by transmission and reflection high-energy electron diffraction (THEED and RHEED), selected area diffraction (SAD) and transmission electron microscopy (TEM) (see Ref. 19).…”
Section: Preparation Of the Samplesmentioning
confidence: 99%