Study of Breakdown Voltage Stability of Gas-Filled Surge Arresters in the Presence of Gamma Radiation

Živanović, Emilija; Zivkovic, Maja; Veljković, Sandra

doi:10.3390/electronics11152447

Cited by 8 publications

(7 citation statements)

References 36 publications

(42 reference statements)

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“…The cumulative distribution function has the form:

where

is the scale parameter, and k is the shape parameter. The Weibull distribution finds use in electric engineering ([ 25 ], p. 55), i.e., in the analysis of an insulator breakdown [ 26 ]. The data were fitted with Octave package statistics.…”

Section: Methodsmentioning

confidence: 99%

Analysis of the Lifetime of Neural Implants Using In Vitro Test Structures

Guljakow

Lang

2023

Sensors

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The aim of this work was to measure the lifetime of neural implant test samples at two different temperatures, using a method that allows the precise measurement of the sample lifetime, further analysis with the use of Weibull statistics, and examination of the applicability of the Van’t Hoff rule. The correct estimation of the lifetime of neural implants is important to avoid preliminary failures, when used in humans. The novelty lies in the precise data due to the measurement approach, the application of the Weibull statistics to neural test samples, and the examination of the Van’t Hoff rule’s applicability to the longevity of polyimide-based neural implant samples. Several samples that consisted of interdigitated gold strands, encapsulated in polyimide were soaked in ringer solution. One batch was soaked at a temperature of 37 °C, and another was soaked at a temperature of 57 °C. Voltage was applied and measured to identify the occurrence of failures. The long-term experiment was stopped after 458 days for the samples at 37 °C and 423 days for the samples at 57 °C, with several samples still being intact at both temperature levels. The time to failure was measured and used to identify the Weibull parameters that would describe the behavior of the samples. The median lifetime of the samples changed from 363 days at 37 °C to 138 days at 57 °C. The scale and shape factor changed from 396 and 3.7 at 37 °C to 138 and 2 at 57 °C, respectively. The measured mean, median times, and Weibull scale factors were lower than expected from the Van’t Hoff rule. The use of the Van’t hoff rule with 2ΔT/10°C for accelerated lifetime tests would lead to an estimation of longer lifetimes than realistic. A reaction rate constant around 1.47 appears more appropriate. While a fourfold difference in lifetime would be expected, only a 2.65-fold difference in the median lifetime and a roughly 2.2-fold difference in the mean and Weibull scale factor were observed. The shift of the Weibull shape parameter from 3.7 at 37 °C to 2 at 57 °C with rising temperatures was observed, indicating differences in failure reasons and stronger aging at lower temperatures. The used method is simple to apply and interpret and allows for a precise anticipation of sample lifetimes.

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“…The cumulative distribution function has the form:

where

Section: Methodsmentioning

confidence: 99%

Analysis of the Lifetime of Neural Implants Using In Vitro Test Structures

Guljakow

Lang

2023

Sensors

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“…There have been several experimental studies aimed at determining the failure modes of ZnO-based varistors used in surge arresters under relevant environmental testing conditions involving multiple lightning strikes or radiation damage. However, these studies lack sufficient information on technical characteristics such as the chemical composition and size of MOV discs, as well as the suppliers of commercial ZnO-based varistors [ 71 , 195 , 196 , 197 , 198 ]. On the other hand, these studies provide relevant findings on the failure mechanisms of MOVs subjected to multiple lightning strikes or radiation exposure (e.g., radium (Ra)-226 or californium (Cf)-252 and neutron/gamma radiation, etc.).…”

Section: Properties Of Disc-shaped Movs From Zno-v 2 ...mentioning

confidence: 99%

“…As a result, electrical characteristics such as the breakdown voltage (V B ) and nonlinear coefficient (α), as well as the radiation protection characteristics of MOV devices, can degrade due to a decrease in electrical conductivity and an increase in the local electric field in the vicinity of dislocations [ 197 ]. Nevertheless, several commercial GFSAs were found to be effective against γ radiation under certain conditions [ 198 ].…”

Section: Properties Of Disc-shaped Movs From Zno-v 2 ...mentioning

confidence: 99%

Effects of Dopants and Processing Parameters on the Properties of ZnO-V2O5-Based Varistors Prepared by Powder Metallurgy: A Review

Lungu¹

2023

Materials

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This article reviews the progress in developing ZnO-V2O5-based metal oxide varistors (MOVs) using powder metallurgy (PM) techniques. The aim is to create new, advanced ceramic materials for MOVs with comparable or superior functional properties to ZnO-Bi2O3 varistors using fewer dopants. The survey emphasizes the importance of a homogeneous microstructure and desirable varistor properties, such as high nonlinearity (α), low leakage current density (JL), high energy absorption capability, reduced power loss, and stability for reliable MOVs. This study investigates the effect of V2O5 and MO additives on the microstructure, electrical and dielectric properties, and aging behavior of ZnO-based varistors. The findings show that MOVs with 0.25–2 mol.% V2O5 and MO additives sintered in air over 800 °C contain a primary phase of ZnO with a hexagonal wurtzite structure and several secondary phases that impact the MOV performance. The MO additives, such as Bi2O3, In2O3, Sb2O3, transition element oxides, and rare earth oxides, act as ZnO grain growth inhibitors and enhance the density, microstructure homogeneity, and nonlinearity. Refinement of the microstructure of MOVs and consolidation under appropriate PM conditions improve their electrical properties (JL ≤ 0.2 mA/cm2, α of 22–153) and stability. The review recommends further developing and investigating large-sized MOVs from the ZnO-V2O5 systems using these techniques.

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“…In addition, scholars have conducted testing and research on different types of gas discharge tubes produced by different manufacturers. Živanović et al studied the breakdown voltage stability and reliability of gas-filled surge arresters produced by CITEL, Litteluse, and EPCOS, and also investigated the impact of gamma radiation on the breakdown voltage of gas-filled surge arresters [30]. Loncar et al used a type of inert gas, pressure in the gas chamber, electrode gap value, electrode material, and electrode surface treatment methods as variable parameters to explore the effects of gamma rays and X-ray radiation on the characteristics of inflatable lightning arresters [31].…”

Section: Introductionmentioning

confidence: 99%

Experimental Study on The Performance of External Open-Circuit Failure Gas Discharge Tubes under Power-Frequency Follow Currents

Lu,

Chen,

et al. 2023

Electronics

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A short-circuit fault in the gas discharge tube (GDT) is one of the latent hazards of electrical equipment. It may cause the ignition of electrical equipment. Therefore, based on the existing GDT, an improved external open-circuit failure gas discharge tube (EOFGDT) which can remove short-circuit (SC) failure is presented in this paper, and its structure and working mechanisms are introduced. This EOFGDT can utilize the combustion and heat transfer of continuous arcs due to SC failures to increase the temperature of its end electrode, so as to induce a solder joint failure, by which the elastic sheet on the solder joint becomes disconnected from the end electrode, forming an external gap that reduces the rising speed and amplitude of the recovery voltage across the arc gap, and eventually forms an open circuit (OC) within the structure. The EOFGDT SC condition was simulated and a test of the EOFGDT ability to remove SC faults by using an 8/20 µs impulse current generator coupled with a power-frequency power supply test bed was conducted. The experimental results show that the magnitude of the SC follow currents, power-frequency voltages, and the impulse currents are positively correlated to the OC response time, which is greatly affected by the power-frequency follow currents. When the SC current reaches 30 A, the EOFGDT OC response time is about 350 ms. The experimental waveform is consistent with the screen result of the OC response time of the EOFGDT, which proves the effectiveness of EOFGDTs for the inhibition of SC follow-current failures.

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Study of Breakdown Voltage Stability of Gas-Filled Surge Arresters in the Presence of Gamma Radiation

Cited by 8 publications

References 36 publications

Analysis of the Lifetime of Neural Implants Using In Vitro Test Structures

Analysis of the Lifetime of Neural Implants Using In Vitro Test Structures

Effects of Dopants and Processing Parameters on the Properties of ZnO-V2O5-Based Varistors Prepared by Powder Metallurgy: A Review

Experimental Study on The Performance of External Open-Circuit Failure Gas Discharge Tubes under Power-Frequency Follow Currents

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