2013 International Mutli-Conference on Automation, Computing, Communication, Control and Compressed Sensing (iMac4s) 2013
DOI: 10.1109/imac4s.2013.6526460
|View full text |Cite
|
Sign up to set email alerts
|

Studies on reliability of PVC-graphite thick film resistors

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
0
0

Year Published

2019
2019
2024
2024

Publication Types

Select...
1
1

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
(1 citation statement)
references
References 8 publications
0
0
0
Order By: Relevance
“…Where ξ is a certain lifetime characteristic; A is a constant, and A > 0;E is the activation energy, which is material-dependent and has units of electron volts, and is denoted by ev; K is Boltzmann's constant for 8.617×10 -5 ev/℃, and since the unit of E/K is temperature, it is also called E/K the activation temperature; T is the absolute temperature; The Arrhenius model suggests that the lifetime characteristics will decrease exponentially with increasing temperature [14]. Taking logarithms on both sides of this model yields.…”
Section: Reliability Accelerated Test Methodsmentioning
confidence: 99%
“…Where ξ is a certain lifetime characteristic; A is a constant, and A > 0;E is the activation energy, which is material-dependent and has units of electron volts, and is denoted by ev; K is Boltzmann's constant for 8.617×10 -5 ev/℃, and since the unit of E/K is temperature, it is also called E/K the activation temperature; T is the absolute temperature; The Arrhenius model suggests that the lifetime characteristics will decrease exponentially with increasing temperature [14]. Taking logarithms on both sides of this model yields.…”
Section: Reliability Accelerated Test Methodsmentioning
confidence: 99%