Studies of nanostructures formed in T-10 tokamak

Kolbasov, B.N.; Stankevich, V. G.; Svechnikov, N. Yu.; Lebedev, Mikhail V.; Menshikov, K. A.; Rajarathnam, D.; Соменков, В. А.; Трунова, В. А.; Велигжанин, А. А.; Zubavichus, Ya. V.

doi:10.1088/1757-899x/23/1/012008

IOP Conf. Ser.: Mater. Sci. Eng.

2011

DOI: 10.1088/1757-899x/23/1/012008

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Studies of nanostructures formed in T-10 tokamak

B.N. Kolbasov

V. G. Stankevich

N. Yu. Svechnikov

et al.

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Recent Developments in the X-Ray Reflectivity Analysis for Rough Surfaces and Interfaces of Multilayered Thin Film Materials

Fujii

2013

Journal of Materials

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X-ray reflectometry is a powerful tool for investigations on rough surface and interface structures of multilayered thin film materials. The X-ray reflectivity has been calculated based on the Parratt formalism, accounting for the effect of roughness by the theory of Nevot-Croce conventionally. However, in previous studies, the calculations of the X-ray reflectivity often show a strange effect where interference effects would increase at a rough surface. And estimated surface and interface roughnesses from the X-ray reflectivity measurements did not correspond to the TEM image observation results. The strange result had its origin in a used equation due to a serious mistake in which the Fresnel transmission coefficient in the reflectivity equation is increased at a rough interface because of a lack of consideration of diffuse scattering. In this review, a new accurate formalism that corrects this mistake is presented. The new accurate formalism derives an accurate analysis of the X-ray reflectivity from a multilayer surface of thin film materials, taking into account the effect of roughness-induced diffuse scattering. The calculated reflectivity by this accurate reflectivity equation should enable the structure of buried interfaces to be analyzed more accurately.

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Recent Developments in the X-Ray Reflectivity Analysis for Rough Surfaces and Interfaces of Multilayered Thin Film Materials

Fujii

2013

Journal of Materials

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show abstract

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Studies of nanostructures formed in T-10 tokamak

Cited by 1 publication

References 11 publications

Recent Developments in the X-Ray Reflectivity Analysis for Rough Surfaces and Interfaces of Multilayered Thin Film Materials

Recent Developments in the X-Ray Reflectivity Analysis for Rough Surfaces and Interfaces of Multilayered Thin Film Materials

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