Structured scintillator for hard x-ray grating interferometry

Rutishauser, Simon; Zanette, Irène; Donath, Tilman; Sahlholm, Anna; Linnros, Jan; Dávid, Christian

doi:10.1063/1.3583464

Cited by 23 publications

(14 citation statements)

References 13 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The Moiré pattern is ideal for the extraction of dark-field scatter by taking the first harmonic of the Fourier transform. The work of Rutishauser et al 6 showed an increase in fringe visibility at X-ray energies around 60 keV (greater than our simulations of 17.5 keV), leading to an improvement in the quality of the differential phase and dark-field data compared to a conventional grating interferometry system.…”

Section: Design Of Structured Scintillatorscontrasting

confidence: 44%

“…The implementation of a structured scintillator 5,6 fits well into our design of an X-ray bi-prism interferometry system with single-exposure Moiré fringe analysis because it reduces crosstalk between pixels of our high-resolution large fringe separation. Though the authors of this referenced work aimed their development for grating systems, a structured scintillator is ideal for our bi-prism interferometry system.…”

Section: A1 Design Of Structured Scintillatorsmentioning

confidence: 90%

See 1 more Smart Citation

X‐ray bi‐prism interferometry—A design study of proposed novel hardware

et al. 2021

View full text Add to dashboard Cite

Purpose: Advances in X-ray phase-contrast imaging can obtain excellent soft-tissue contrast of phase-shift, attenuation, and small angle scatter. Here we present fringe patterns for different design parameters of Xray bi-prism interferometry imaging systems. Our aim is to develop bi-prism interferometry imaging systems with excellent polychromatic performance that produce high-contrast fringes with spatially incoherent X-ray illumination. We also introduce a novel X-ray tube design that uses temporal multiplexing to provide simultaneous virtual "electronic phase stepping" that replace "mechanical phase stepping" popular with grating-based interferometry setups. Methods:In our investigation we develop expressions for the irradiance distribution pattern of a bi-prism interferometer comprised of multiple point sources and multiple bi-prisms. These expressions are used to plot fringe patterns for X-ray design parameters including size of point source, number of point sources, and point source separation; and bi-prism design parameters including material, angle, number of biprisms, period, and bi-prism array to X-ray source and to detector distances. Results:Results show that the fringe patterns for a bi-prism interferometry system are not longitudinally periodic as with grating interferometers that produce a Talbot-Lau carpet. It is also shown that at 59 keV Xrays the bi-prism material should be something comparable to nickel to obtain reasonable fringe visibility. Conclusion:The irradiance distribution pattern demonstrates that bi-prism interferometry may provide comparable or improved fringe visibility to that of gratings. Special care is given to present our findings within the context of previous advancements. A single-shot image acquisition approach using a temporal multiplexed, high-power X-ray source provides virtual electronic phase stepping without focal spot sweeping. This provides multiple images, each at the same exposure and the same projection view, from different fringe locations that allow one to derive the attenuation, phase, and dark-field images of the sample without mechanical phase stepping of a grating.

show abstract

Section: Design Of Structured Scintillatorscontrasting

confidence: 44%

Section: A1 Design Of Structured Scintillatorsmentioning

confidence: 90%

X‐ray bi‐prism interferometry—A design study of proposed novel hardware

et al. 2021

View full text Add to dashboard Cite

show abstract

“…This arrangement can provide superior contrast, as the residual transmission is not recorded by the camera, which observes only the visible light produced by the scintillator material. Such a grating would be the two-dimensional equivalent to the one-dimensional structured scintillator grating as described elsewhere [32,33].…”

Section: Grating Fabricationmentioning

confidence: 99%

Fabrication of two-dimensional hard X-ray diffraction gratings

Rutishauser¹,

Bednarzik²,

Zanette³

et al. 2013

Microelectronic Engineering

View full text Add to dashboard Cite

“…A detailed description of the grating production process is given by David et al (2007) and Rutishauser et al (2013b). Alternatively, gratings can be produced by the LIGA technique (Reznikova et al, 2008;Noda et al, 2008) or metal assisted chemical etching (Romano et al, 2016), respectively, the absorption grating can be replaced by a structured scintillator (Rutishauser et al, 2011).…”

Section: Xgi Setupmentioning

confidence: 99%

X-ray grating interferometer for in situ and at-wavelength wavefront metrology

Kayser

Dávid

Flechsig

et al. 2017

J Synchrotron Radiat

Self Cite

View full text Add to dashboard Cite

Edited by M. Yabashi, RIKEN SPring-8 Center, JapanKeywords: X-ray grating interferometry; wavefront metrology; X-ray optics; XFELs.X-ray grating interferometer for in situ and at-wavelength wavefront metrology Yves Kayser,* Christian David, Uwe Flechsig, Juraj Krempasky, Volker Schlott and Rafael Abela Paul Scherrer Institut, 5232 Villigen PSI, Switzerland. *Correspondence e-mail: yves.kayser@psi.ch A wavefront metrology setup based on the X-ray grating interferometry technique for spatially resolved, quantitative, in situ and at-wavelength measurements of the wavefront at synchrotron radiation and hard X-ray freeelectron laser beamlines is reported. Indeed, the ever-increasing demands on the optical components to preserve the wavefront shape and the coherence of the delivered X-ray beam call for more and more sensitive diagnostic instruments. Thanks to its angular sensitivity, X-ray grating interferometry has been established in recent years as an adequate wavefront-sensing technique for quantitatively assessing the quality of the X-ray wavefront under working conditions and hence for the in situ investigation of X-ray optical elements. In order to characterize the optical elements at any given beamline by measuring the aberrations introduced in the wavefront, a transportable X-ray grating interferometry setup was realised at the Swiss Light Source (SLS). The instrument, which is expected to be a valuable tool for investigating the quality of the X-ray beam delivered at an endstation, will be described hereafter in terms of the hardware setup and the related data analysis procedure. Several exemplary experiments performed at the X05DA Optics beamline of the SLS will be presented.

show abstract

Structured scintillator for hard x-ray grating interferometry

Cited by 23 publications

References 13 publications

X‐ray bi‐prism interferometry—A design study of proposed novel hardware

X‐ray bi‐prism interferometry—A design study of proposed novel hardware

Fabrication of two-dimensional hard X-ray diffraction gratings

X-ray grating interferometer for in situ and at-wavelength wavefront metrology

Contact Info

Product

Resources

About