“…Thus, the innovations on illumination method led to many variants based on SIM with higher resolution, such as SSIM, [44] NL-SIM, [46] PSIM, [52,103] LPSIM, [106,107,159,199,200] and cSIM. [102] The theory also applies to any illumination patterns with high spatial frequencies, such as confocal microscopy and the related spot scanning SIM, which exploit a diffraction-limited excitation focus (or multi-foci) to scan the sample. The excitation focus contains all spatial frequencies up to the cutoff frequency of the condenser objective, enabling a doubled resolution.…”