Abstract:Structured illumination microscopy (SIM) is a method of non-invasively extracting depth information about a specimen. By using modulated light focused at a discrete depth, it is able optically section a single plane of focus, even in the presence of scattered light from other, out-of-focus planes. However, in order for images to be accurately extracted, the modulation pattern must be positioned into three discrete phases, whose alignment is critical to artifact-free reconstruction. Due to this constraint, SIM … Show more
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