Structure property relationships in a nanoparticle-free SmBCO coated conductor

Abstract

We examine the temperature, field and field angle dependence of the critical current of a SmBa2Cu3Oy coated conductor produced by reactive co-evaporation. A transmission electron microscopy based microstructural analysis shows the film contains extended c-axis defects, stacking faults, and two different species of inclined defects. By applying a maximum entropy decomposition of the field angle dependent critical current Ic(θ) datasets we are able to identify the individual contributions of these defects to the critical current even though they do not produce distinct peaks but rather an anisotropy in Ic(θ). We are able to confirm the structure property relationships by determining the matching fields where each of the individual defect contributions are a maximum and showing that these are consistent with the observed microstructure. For a critical current component having a maximum magnitude at an intermediate temperature we propose a model of thermally activated depinning to explain the behaviour.

Effect of the proton irradiation on the thermally activated flux flow in superconducting SmBCO coated conductors

“…On the other hand, U H ( ) 0 shows approximately 1/H dependence in the pristine sample. SmBCO coated conductors fabricated in a similar manner have been reported to have correlated disorders such as dislocations and splayed extended-c-axis defects 36 . According to papers reported previously, the dislocations in all directions stabilize the Bose glass phase at low temperatures and the vortex lines are disentangled in the vortex liquid state seen in higher temperature ranges, which causes a dependency of U 0 ~ 1/H 20,[37][38][39][40][41] .…”

Thermodynamic Parameters of Single‐ or Multi‐Band Superconductors Derived from Self‐Field Critical Currents

“…Finally we studied a commercial wire manufactured by Superconductor Technology Incorporated (STI) which is free of artificial pinning centers. This wire was studied by high-resolution transmission electron microscopy and infield critical current measurements were made by other members of our group 142 . It was confirmed that the wire does not contain any artificial pinning nanoparticles and, moreover, there is relatively low density of other types of defects that might serve as pinning centres.…”

Tilted BaHfO3nanorod artificial pinning centres in REBCO films on inclined substrate deposited-MgO coated conductor templates

“…A full dependence of the angle of the nanorod peak (θ NR ) on T and μ 0 H is presented in figure 7. This was determined by fitting the anisotropy curves using two angular Gaussian components and an isotropic component as per the method applied by Knibbe et al [25]. Notably, at intermediate temperatures and fields the peak shifts in the opposite direction towards the sample surface normal, with the smallest angle of 12°occurring at 70 K, 2 T. This shift is most likely a result of misalignment between the internal magnetic field (B) and H, which arises for REBCO films with tilted correlated pinning centres, as described by Maiorov et al [26].…”