1995
DOI: 10.1016/s0040-6090(94)06508-x
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Structure of epitaxial δ-NbN films deposited by cathode reactive sputtering

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Cited by 7 publications
(2 citation statements)
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“…In each case, even where single-crystal NbN was formed, the structure was locally highly defective (in agreement with the results of Shalaeva et al (1995)). Whilst no discrete threading dislocations were observed in these single-crystal NbN films, the dark-field contrast was indicative of local strains, and the common termination of fringes in high-resolution images such as figure 7 (inset) indicates small stacking faults and vacancy loops.…”
Section: Discussionsupporting
confidence: 88%
“…In each case, even where single-crystal NbN was formed, the structure was locally highly defective (in agreement with the results of Shalaeva et al (1995)). Whilst no discrete threading dislocations were observed in these single-crystal NbN films, the dark-field contrast was indicative of local strains, and the common termination of fringes in high-resolution images such as figure 7 (inset) indicates small stacking faults and vacancy loops.…”
Section: Discussionsupporting
confidence: 88%
“…Studies of nitride coatings involve non-uniform and disordered structures. NbN is a binary nitride coating with enhanced superconductor characteristics that has been the subject of studies since the 1980s [1][2][3][4]. The lattice direction ratio for a NbN coating changes as the number of nitrogen vacancies changes for various preparation conditions.…”
Section: Introductionmentioning
confidence: 99%