1979
DOI: 10.1107/s0567740879010153
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Structure of dilithium zinc silicate γII-Li2ZnSiO4

Abstract: 2678fl-VANADIUM NITRIDE hedral holes. Despite the low scattering power of V for neutrons, neutron diffraction was used because N has a large scattering power. Hence, in this experiment the structure was determined solely by the N atom positions. The investigation confirmed that fl-V2N has the e-Fe2N structure, similar to fl-Nb2N and fl-Ta2N.Acknowledgement is made to the Carlsberg Fondet for supplying a spark-erosion machine for the crystalgrowth project.References BACON, G. E. (1972). Acta Cryst. A28, 357-358… Show more

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Cited by 27 publications
(18 citation statements)
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“…As expected from the Li 2 MSiO 4 (M ϭMg,Zn) structure, 11,26 Cr ions in these materials are found in distorted tetrahedral coordination. Cr:Li 2 ZnSiO 4 contains much more Cr V than Cr:Li 2 MgSiO 4 .…”
Section: E Influence Of the Reducing Treatmentsupporting
confidence: 63%
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“…As expected from the Li 2 MSiO 4 (M ϭMg,Zn) structure, 11,26 Cr ions in these materials are found in distorted tetrahedral coordination. Cr:Li 2 ZnSiO 4 contains much more Cr V than Cr:Li 2 MgSiO 4 .…”
Section: E Influence Of the Reducing Treatmentsupporting
confidence: 63%
“…III͒, which offers the best compromise, as far as size and charge compatibilities are concerned: r(Cr V )ϭ0.45 Å, r(Si IV )ϭ0.26 Å. 26 The charge compensation, which is necessary to accommodate Cr V , could be achieved either by the formation of cation vacancies in the vicinity of the substitution site, or by replacing a Mg 2ϩ ion by Li ϩ . In both cases, this would induce a distortion of the tetrahedral Cr V sites.…”
Section: Electron Paramagnetic Resonance: Evidence Of Cr Vmentioning
confidence: 99%
“…These main peaks were indexed to the Li 2 ZnSiO 4 crystals with diffractions at (110), (101), (002), etc. 23 Other AG and GC samples doped with different potassium compounds (K 2 CO 3 /KNO 3 ) or different Fe 2 O 3 concentration (from 0 to 0.28 mol%) show almost the same diffraction patterns as those in Fig. 2.…”
Section: Resultsmentioning
confidence: 58%
“…The XRD pattern of the GC14‐O sample contains several sharp peaks superimposing on the broad diffraction bands. These main peaks were indexed to the Li 2 ZnSiO 4 crystals with diffractions at (110), (101), (002), etc …”
Section: Resultsmentioning
confidence: 99%
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