1998
DOI: 10.1016/s0169-4332(98)00201-3
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Structure characterization of vanadium oxide thin films prepared by magnetron sputtering methods

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Cited by 80 publications
(30 citation statements)
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“…6 shows the XPS plot. Taking into account the results of the work [2,6] we cannot conclude which kind of vanadium oxide exist in reality. Using the results shown in Fig.…”
Section: Auger Electron Spectroscopy (Aes) and Photoelectron Spectrosmentioning
confidence: 92%
See 1 more Smart Citation
“…6 shows the XPS plot. Taking into account the results of the work [2,6] we cannot conclude which kind of vanadium oxide exist in reality. Using the results shown in Fig.…”
Section: Auger Electron Spectroscopy (Aes) and Photoelectron Spectrosmentioning
confidence: 92%
“…There are different methods to produce such layers. One example is the deposition of vanadium oxides on substrates by reactive sputtering, as described by Cui [2].…”
Section: Introductionmentioning
confidence: 99%
“…In the last decades, many techniques for thin film growth including sputtering [12], [13], evaporation [14], [15], pulsed laser deposition [16], and sol-gel process [17], [18], etc. have been adopted to deposit VO 2 films on various substrates.…”
Section: Introductionmentioning
confidence: 99%
“…Hence, to make the bolometer layer compatible with the CMOS ROIC, the deposition temperature of VO x material should be kept under 400°C [2]. 1350 A wide range of deposition methods has been utilized to deposit VO x thin films, including sputtering [3], evaporation [4], chemical vapor deposition [5,6], pulsed laser deposition [2], as well as sol-gel methods [7]. Reactive ion beam sputtering permits greater control over deposition parameters and provides an important fabrication approach for optimization of vanadium oxide thin film materials to meet various applications.…”
Section: Introductionmentioning
confidence: 99%