2006
DOI: 10.1016/j.apsusc.2006.02.046
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Structure and properties of transparent conductive doped ZnO films by pulsed laser deposition

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Cited by 154 publications
(70 citation statements)
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“…This is consistent with the observed lower carrier concentrations measured in SP deposited films compared with zinc rich environments of well-studied vacuum techniques such as PLD and magnetron sputtering -where carrier concentrations in the order of 10 21 cm -3 are reported. 47,48 As the Fermi energy rises with increasing free carrier concentration 49 , the formation energy of a dopant occupying a substitutional site increases. In parallel, the formation energy of an Al Zn V Zn acceptor hybrid defect decreases and, in oxygen rich conditions, falls below that of the Al Zn.…”
Section: Resultsmentioning
confidence: 99%
“…This is consistent with the observed lower carrier concentrations measured in SP deposited films compared with zinc rich environments of well-studied vacuum techniques such as PLD and magnetron sputtering -where carrier concentrations in the order of 10 21 cm -3 are reported. 47,48 As the Fermi energy rises with increasing free carrier concentration 49 , the formation energy of a dopant occupying a substitutional site increases. In parallel, the formation energy of an Al Zn V Zn acceptor hybrid defect decreases and, in oxygen rich conditions, falls below that of the Al Zn.…”
Section: Resultsmentioning
confidence: 99%
“…While synthesizing TCO thin films, it is a common practice to introduce impurities such as In, Al, Ga, N, P, As and F [5], within ZnO thin films in order to enhance the optoelectronic properties. ZnO : Ga (GZO) thin films have been deposited by several techniques such as molecular beam epitaxy [6], pulsed laser deposition [7], sintering [8], chemical spray [9,10], rf magnetron sputtering [11], ion plating [12] and solid state reaction [13]. Photoluminescence (PL) and 3 Author to whom any correspondence should be addressed.…”
Section: Introductionmentioning
confidence: 99%
“…Therefore, resistivity decreases with oxygen partial pressure from 20 to 80 m Torr, reaches a minimum at 80 m Torr, and then increases at oxygen partial pressure above 80 m Torr. Since, electrons in the SnO 2 : Ga 2 O 3 films are supplied from oxygen vacancies and gallium atoms in the films, it can be thought that an increase of oxygen content might cause a decrease of the oxygen vacancies, results in increase of resistivity 10) . Fig.…”
Section: Resultsmentioning
confidence: 99%