2018
DOI: 10.2514/1.i010594
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Structure and Online Self-Repair Mechanisms for Digital Systems Based on System-on-Programmable-Chip

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Cited by 2 publications
(4 citation statements)
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“…The run time increases with nodes and with random atmospheric conditions. In future, it is planned to use a high performance computing platform to exercise the full potential of the framework with maximum nodes and random environment conditions to realise self-healing electronics architecture 21 . Figure 6.…”
Section: Discussionmentioning
confidence: 99%
“…The run time increases with nodes and with random atmospheric conditions. In future, it is planned to use a high performance computing platform to exercise the full potential of the framework with maximum nodes and random environment conditions to realise self-healing electronics architecture 21 . Figure 6.…”
Section: Discussionmentioning
confidence: 99%
“…E.g., the LUT of 5/6/7 series FPGA has 6 inputs, whose configuration content has 2 6 = 64 bits in total, i.e., 4 16bit half-words. Therefore, a 4*16 character array 𝑐 𝑓 [] [] is adopted to describe its configuration content, the value of 𝑐 𝑓 [π‘˜] [𝑖𝑙] can be determined by (5).…”
Section: Modeling Lut Resource 1) Modeling Location Of Lut Resourcementioning
confidence: 99%
“…Step3: Calculate k and il bit-by-bit according to ( 6)-( 7), and obtain the value of 𝑐 𝑓 [π‘˜] [𝑖𝑙] according to (5) Step2: Calculate Colofs and introfs for each routing path. Assume that the source and sink CLB coordinates are (srcrow, srccol) and (sinkrow, sinkcol), then the column offset Colofs for L1/L2/L3 can be calculated by (11); and the intra-frame offset introfs for them can be calculated by ( 12) and ( 13), respectively, where CPRR represents the number of CLBs in the minimum RR.…”
Section: Chromosome Decoding and Cb Online Generationmentioning
confidence: 99%
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