Structural and Raman study of PrFe 1Àx Ni x O 3 (0 x 0.5) thin films deposited on LaAlO 3 substrate by Pulse laser deposition is presented. Structural analysis by X-ray diffraction shows that these films are highly epitaxial grown along the c-axis with (0 0 l) orientation and have an orthorhombic structure with space group Pbnm throughout the doping range. From Raman spectrum, a new peak starts developing at around 574 cm À1 in this system with Ni doping. However, after x ¼ 0.3 Ni concentration, there is a decline in intensity of this observed peak and for x ! 0.3, it (this mode) becomes hard to resolve with other observed modes. The generation of this new peak (574 cm À1 ) in the other similar system (LaFe 1Àx Ni x O 3 ) with Ni doping is also observed. This study is a direct indication of a structural phase transition (SPT) or symmetry breaking in the present and related systems. The established orthorhombic structure for the present and related system is doubtful.