2014
DOI: 10.1007/s13391-013-3091-5
|View full text |Cite
|
Sign up to set email alerts
|

Structure and electrical properties of AlN films prepared on PZT films by the DC reactive magnetron sputtering

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2015
2015
2015
2015

Publication Types

Select...
1

Relationship

0
1

Authors

Journals

citations
Cited by 1 publication
(1 citation statement)
references
References 17 publications
0
1
0
Order By: Relevance
“…To control and optimize these properties is an important and active subject for the growth of AlN films. AlN films can be prepared by various techniques such as chemical vapor deposition (CVD) [6,7], reactive magnetron sputtering [1,8], molecular beam epitaxy (MBE) [9,10], ion beam-assisted deposition, and metal organic chemical vapor deposition (MOCVD) [11].…”
Section: Introductionmentioning
confidence: 99%
“…To control and optimize these properties is an important and active subject for the growth of AlN films. AlN films can be prepared by various techniques such as chemical vapor deposition (CVD) [6,7], reactive magnetron sputtering [1,8], molecular beam epitaxy (MBE) [9,10], ion beam-assisted deposition, and metal organic chemical vapor deposition (MOCVD) [11].…”
Section: Introductionmentioning
confidence: 99%