Structural studies of Fe/Pd magnetic multilayers by x-ray diffraction

Heterostructures design for Hf-Nitride/V-Nitride system

“…Due to changes in the XRR signal for the Si(100) and HfN/VN system are hardly observable and considering that XRR problems can be seen as an XRD problem. So, the signals changes in one unit cell film of a material with the out-of-plane parameter equal to the thickness of the sample is necessary to determine the true critical angle, deriving the signal reflectivity in relation to (θ) angle like (dR/dθ) [11,20,27], as such is shown in Fig. 8.…”

“…(2) [11,27]. where θ c is the critical angle, ρ e is the electronic density, r e is the electron radius (2.817950*10 À 15 m), λ is the wavelength of X-ray ( Moreover, in the hard X-ray region, the refractive index (n) of the materials is smaller than unity value (1).…”

“…This is a consequence of the repeated resonant behavior of many possible electronic transitions up to the X-ray region, therefore, the refraction index for HfN/VN was determined by Eq. (4) [11,27,28]:…”

Structural studies ofNixFe100−x/Momagnetic multilayers by x

“…If the samples are not highly crystalline and have only a moderate number of periods, we can apply the modified kinematic theory to calculate the interface roughness: 16,17 ϭ ⌳…”

Mechanical and surface analysis of Ti0.4Al0.6N/Mo multilayers

“…Therefore, the scattering solely arises from the chemical modulation of the structure. The modulation period can be experimentally assessed through the position of the low-angle Bragg di!raction peaks [10,11]:…”