“…MBE studies have reported a high density (10 8 cm Ϫ2 ) of stacking faults if the III-V surface was exposed initially to a flux of elemental Se, while exposure to a Zn flux prior to II-VI growth led to much lower stacking fault densities. 6,8,9 Based on reflection high energy electron diffraction ͑RHEED͒ results, this was associated with the nucleation of three-dimensional islands in the early stages of II-VI growth on Se-predosed surfaces as opposed to twodimensional growth on Zn-predosed surface. 5,6,8,9 However, a recent study of pseudomorphic ZnSe/GaAs͑001͒ heterostructures grown by metalorganic chemical vapor deposition reported an increase in the stacking fault density for heterostructures fabricated after exposure to Zn of the As-stabilized substrate, as well as for growth on surfaces on which excess As was present.…”