2019
DOI: 10.1080/01411594.2019.1581886
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Structural, optical and gas sensing properties of Cu2O/CuO mixed phase: effect of the number of coated layers and (Cr + S) co-Doping

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Cited by 38 publications
(18 citation statements)
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“…Table 3 show that Optical band gap, refractive index and extinction coefficient values increase with increasing film thickness up to 4 at% Cu doping and then started to increase. These obtained values satisfy with other works [7,10,11]. Figure 5 ; where R is the reflectance; F(R) is propotional to the absorption coefficient.…”
Section: Optical Propertiessupporting
confidence: 90%
See 1 more Smart Citation
“…Table 3 show that Optical band gap, refractive index and extinction coefficient values increase with increasing film thickness up to 4 at% Cu doping and then started to increase. These obtained values satisfy with other works [7,10,11]. Figure 5 ; where R is the reflectance; F(R) is propotional to the absorption coefficient.…”
Section: Optical Propertiessupporting
confidence: 90%
“…A good number of research work have been done on the synthesis and characterization of Al, Ag, Co, and Cr, etc. doped MnO 2 thin films [7][8][9][10]. Supplementary to these metals, Cu has a great deal of diligence dopant because of its low cost, good electrical conductivity, non-toxicity and environmentally friendly nature [11].…”
Section: Introductionmentioning
confidence: 99%
“…The ionic radius of Cs + (272 pm) is higher than that of Na + (191 pm) and Li + (76 pm). Also, using the crystallographic plane indices (hkl), the a and c lattice constants, interplanar distance (d), the volume of the unit cell (V), dislocation constant (δ), the bond length (L), and the strain () are also calculated by Equations ) and shown in Table 1 36‐39 normald=normalλ/20.25emsinθ 1normald0.25em=430.25em()normalh2+normalk2+hka2+normall2normalc2false] normalV=32a20.25emnormalc normalL=false(normala23+12u2c20.25emand0.25emnormalU=()130.25em()a2c2+14 normalδ=D2 normal∈=0.250.25emnormalβ0.25emcot0.25emnormalθ …”
Section: Resultsmentioning
confidence: 99%
“…Also, using the crystallographic plane indices (hkl), the a and c lattice constants, interplanar distance (d), the volume of the unit cell (V), dislocation constant (δ), the bond length (L), and the strain (∈) are also calculated by Equations (3)-(8) and shown in Table 1. [36][37][38][39] d = λ=2 sinθ ð3Þ…”
Section: Structural Propertiesmentioning
confidence: 99%
“…For RW0.03, there are three peaks of Sr11Mg2Si10, located at 2θ = 29.59°, 30. The angle of X-ray diffraction is inversely related to the interplanar distance according to Bragg's equation: [61][62][63][64] m λ = 2 d sin θ…”
Section: Xrd Structure Analysismentioning
confidence: 99%