2012
DOI: 10.1016/j.optlastec.2011.08.021
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Structural, optical and dispersion characteristics of nanocrystalline GaN films prepared by MOVPE

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Cited by 54 publications
(10 citation statements)
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“…It can be observed that the values of χ (3) decrease, because they depend on the values of the static refractive index, that decrease with the increasing power of the pulsed laser annealing due to the improvement of the crystallinity degree of ZnSe thin film samples. These results are in good agreement with the previous literature[52][53][54]. The nonlinear refractive index is related to the optical band gap (E g ) as expressed by the semi-empirical relation proposed by Tichá and Tichý[55]:…”
supporting
confidence: 91%
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“…It can be observed that the values of χ (3) decrease, because they depend on the values of the static refractive index, that decrease with the increasing power of the pulsed laser annealing due to the improvement of the crystallinity degree of ZnSe thin film samples. These results are in good agreement with the previous literature[52][53][54]. The nonlinear refractive index is related to the optical band gap (E g ) as expressed by the semi-empirical relation proposed by Tichá and Tichý[55]:…”
supporting
confidence: 91%
“…where B = 1.7× 10 ିଵ [esu] and is independent on the frequency, while n(0) is the static refractive index of samples [52,53]. It is worthy to mention here that the third-order nonlinear susceptibility χ (3) can be generalized for both the crystalline and amorphous materials [50][51][52][53].…”
Section: Nonlinear Optical Analysis and Optical Electronegativitymentioning
confidence: 99%
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“…The E g value of GaN thin films was found to be B3.45 eV, which is relatively close to the widely accepted value of 3.43 eV for GaN thin films. 45 The E g value of The refractive index dispersion curves of In x Ga 1Àx N thin films were determined using spectroscopic ellipsometry measurements and the following data analysis. Fig.…”
Section: Resultsmentioning
confidence: 99%
“…In addition, depending on refractive index (n), the molar polarizability (α p ) in the UV-Vis region (200-800 nm) can be determined from the local-field polarizability model of Clausius-Mossotti [67,68] :…”
Section: Linear and Nonlinear Optical Propertiesmentioning
confidence: 99%