2021
DOI: 10.1016/j.tsf.2021.138547
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Structural, morphological and optical properties of Cu–Fe–Sn–S thin films prepared by electrodeposition at fixed applied potential

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Cited by 13 publications
(6 citation statements)
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“…50−53 The rutile 110, anatase 101, and the brookite 211 reflections were fitted using a Lorentz profile (see Figure S9 and Table T1), the fwhm used to calculate the coherence length along the corresponding crystallographic direction being the difference between the experimental fwhm and the instrument function. 54 The size value decreased from an average of 64 to 9 nm due to the formation of anatase and brookite phases. During the analysis of the diffractograms, it was determined that some of the samples have a mixed-phase composition of TiO 2 .…”
Section: Resultsmentioning
confidence: 99%
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“…50−53 The rutile 110, anatase 101, and the brookite 211 reflections were fitted using a Lorentz profile (see Figure S9 and Table T1), the fwhm used to calculate the coherence length along the corresponding crystallographic direction being the difference between the experimental fwhm and the instrument function. 54 The size value decreased from an average of 64 to 9 nm due to the formation of anatase and brookite phases. During the analysis of the diffractograms, it was determined that some of the samples have a mixed-phase composition of TiO 2 .…”
Section: Resultsmentioning
confidence: 99%
“…Note that most of the brookite diffraction lines are overlapped by those of anatase, , and only the 211 reflection at 2θ = 30.8° emphasizes the presence of the brookite phase. The average crystallite sizes of the studied TiO 2 were inferred from the XRD patterns using Scherer’s formula. The rutile 110, anatase 101, and the brookite 211 reflections were fitted using a Lorentz profile (see Figure S9 and Table T1), the fwhm used to calculate the coherence length along the corresponding crystallographic direction being the difference between the experimental fwhm and the instrument function …”
Section: Resultsmentioning
confidence: 99%
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“…The band gaps of the as-deposited and sulfurized CZTS thin films are shown in Figure 6. The transmittance measurements were performed using an ellipsometer, and the optical band gap was determined using the following equation [50]:…”
Section: Resultsmentioning
confidence: 99%
“…The band gaps of the as-deposited and sulfurized CZTS thin films are shown in Figure 6 . The transmittance measurements were performed using an ellipsometer, and the optical band gap was determined using the following equation [ 50 ]: Abs(E) = ln (1/T) = C.d.√(E − E g ) where Abs(E) is the derived absorbance using the measured transmittance (T), E is the photon energy, C is the constant of proportionality, d is the film thickness, and E g is the optical band gap. E g was estimated using the Tauc plot by plotting (αE) 2 vs. (E) (where α is the absorption coefficient) near the absorption edge.…”
Section: Resultsmentioning
confidence: 99%