1993
DOI: 10.1016/0168-583x(93)90777-4
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Structural modifications of yttrium iron garnet after high-energy heavy ion irradiations

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Cited by 30 publications
(20 citation statements)
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“…The good concordance between swelling and XRD results indicates that swelling in Y 3 Al 5 O 12 is due to the volume expansion induced by the phase transition from crystalline to amorphous phase, in agreement with observation made in other oxides [35][36][37][38]. It is also important to note that for the same mean electronic stopping power (31 keV/nm) (see Fig.…”
Section: Discussionsupporting
confidence: 80%
“…The good concordance between swelling and XRD results indicates that swelling in Y 3 Al 5 O 12 is due to the volume expansion induced by the phase transition from crystalline to amorphous phase, in agreement with observation made in other oxides [35][36][37][38]. It is also important to note that for the same mean electronic stopping power (31 keV/nm) (see Fig.…”
Section: Discussionsupporting
confidence: 80%
“…[42][43][44][45][46][47][48][49] For mica, e.g., the radius of the protrusions 46 coincides well with the track radius deduced from other techniques 24 since the protrusions are negligible due to fresh cleaving or very little on a surface directly exposed to ion irradiation (in contrast to other materials, the height of the protrusions in mica are too small for quantitative size analysis 47 ). The results obtained from several direct (TEM, SFM) and indirect [Mössbauer spectrometry, Channeling Rutherford Backscattering (C-RBS) and x-ray diffraction (XRD)] observation methods lead to a consistent determination of the S e thresholds in various amorphizable insulators including mica, 24,43,46,48,50,51 yttrium iron garnet (Y 3 Fe 5 O 12 ), 52,53 gadolinium gallium garnet (Gd 3 Ga 5 O 12 ), 54,55 and crystalline quartz (SiO 2 ). 30,56 When comparing track sizes and S e thresholds from different irradiation experiments, it is important to check if the velocities of the projectiles are similar.…”
Section: -1mentioning
confidence: 99%
“…We have also shown by high-resolution transmission electron microscopy ͑HRTEM͒ that, in the low ion velocity range, recrystallization of the amorphous tracks occurs in undoped YIG thin epitaxial films due to track overlap at a low a͒ Author to whom correspondence should be addressed; electronic mail: costantini@drnsac.cea.fr at CEA/SACLAY, DMT/SEMI, F-31131, GiF-SUR-YVETTE Cedex, France fluence. 6,7 A nanocrystalline phase is then produced under the ion beams with grain sizes around 10 nm 6 and a much larger electrical conductivity. 7 The nanograins are embedded within a matrix made of amorphous and single-crystalline YIG with relative fractions depending on the fluence and S e .…”
Section: Introductionmentioning
confidence: 99%
“…7 The nanograins are embedded within a matrix made of amorphous and single-crystalline YIG with relative fractions depending on the fluence and S e . 6 At a fluence of 4.5ϫ10 12 cm Ϫ2 with 50 MeV 63 Cu ion irradiations ͑90% of amorphous phase͒, the nanograins are widely separated with an average distance around 20 nm that decreases at higher fluence when the recrystallization proceeds. 6 The thermal spike model was then adapted to interpret the nanophase formation from the amorphous phase in the same way as was done in the case of amorphous track formation.…”
Section: Introductionmentioning
confidence: 99%
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