2016
DOI: 10.1209/0295-5075/115/27006
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Structural, electronic, and magnetic investigation of magnetic ordering in MBE-grown Cr x Sb 2−x Te 3 thin films

Abstract: We report the structural, electronic, and magnetic study of Cr-doped Sb2Te3 thin films grown by a two-step deposition process using molecular-beam epitaxy (MBE). The samples were investigated using a variety of complementary techniques, namely, x-ray diffraction (XRD), atomic force microscopy, SQUID magnetometry, magneto-transport, and polarized neutron reflectometry (PNR). It is found that the samples retain good crystalline order up to a doping level of x = 0.42 (in CrxSb2−xTe3), above which degradation of t… Show more

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Cited by 25 publications
(59 citation statements)
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“…The thin film deposition took place at a substrate temperature of 250 • C. A detailed description of the growth procedure can be found in Ref. [14].…”
Section: Methodsmentioning
confidence: 99%
See 4 more Smart Citations
“…The thin film deposition took place at a substrate temperature of 250 • C. A detailed description of the growth procedure can be found in Ref. [14].…”
Section: Methodsmentioning
confidence: 99%
“…Structural and magnetic characterization was carried out using XRD and SQUID magnetometry (for details see Ref. [14]). Out-of-plane XRD measurements show that the films are free from secondary phases, such as chromium tellurides, which have T C s between 180 and 340 K [24].…”
Section: Methodsmentioning
confidence: 99%
See 3 more Smart Citations