Structural basis for a naphthyl end-capped oligothiophene with embedded metallic nanoparticles for organic field-effect transistors

Abstract

M. (2018). Structural basis for a naphthyl end-capped oligothiophene with embedded metallic nanoparticles for organic field-effect transistors. Applied Physics Letters, 113(25), [251903]. https://doi.

Modeling of Grazing-Incidence X-ray Diffraction from Naphthyl End-Capped Oligothiophenes in Organic Field-Effect Transistors

“…In this paper, we report detail structural analyses of NaT2 and NaT3 thin-films in OFETs using both molecular modeling and a customized refinement of the GIXRD data with 1D “layer-line” scans of the 2D detector data. This work extends prior characterization and device studies of NaT2 , and NaT3 . NaT2 thin films adopt a structure similar to that of the reported bulk phase, whereas NaT3 thin films yield a much more disordered layer structure which we identify here as a substrate SIP.…”

“…This work extends prior characterization and device studies of NaT2 13,14 and NaT3. 15 NaT2 thin films adopt a structure similar to that of the reported bulk phase, whereas NaT3 thin films yield a much more disordered layer structure which we identify here as a substrate SIP. Molecular modeling calculations indicate that local intermolecular packing disorder is an important complicating factor in this class of compounds.…”

“…The in-plane NaT3 coherence length is similar to that of NaT2. Detailed assessments of crystal sizes for NaT2 and NaT3 samples are reported in Table 3 in ref and in Table 1 of ref , respectively. These crystal sizes are generally insensitive to film thickness.…”

“…previously. [13][14][15] NaT2 and NaT3 have many similarities. Phenomenologically, these films exhibit a plate like crystal habit when grown on SiO 2 .…”

Structural Effects of Electrode Proximity in Vacuum‐Deposited Organic Semiconductors Studied by Microfocused X‐Ray Scattering

“…Another key use for μGIWAXS concern working devices in operando, as very recently demonstrated by Grodd et al [ 32 ] We also see obvious benefits from microfocused grazing‐incidence small‐angle X‐ray scattering (μGISAXS) for probing nanoparticles and other larger structures incorporated within the electrodes. [ 33 ] The availability of submicrobeam experiments at certain beamlines allows for even higher spatial resolutions, enabling detailed studies of samples, where gradient‐type structures are present. [ 34 ] In such cases, extra attention must be placed on possible radiation damage in the sample.…”