2020
DOI: 10.1021/acs.cgd.0c00281
|View full text |Cite
|
Sign up to set email alerts
|

Modeling of Grazing-Incidence X-ray Diffraction from Naphthyl End-Capped Oligothiophenes in Organic Field-Effect Transistors

Abstract: The structure of two naphthylene-capped oligothiophene, 5,5 -bis(naphth-2-yl)-2,2bi-and tri-thiophene, thin-film field-effect transistor assemblies has been studied using modeling in conjunction with grazing incidence x-ray diffraction. Although the well known herringbone molecular packing motif is observed in these films for both compounds, density functional calculations and molecular mechanics modeling give evidence for a local polymorphic ordering in which these molecules can be flipped 180 • about the lon… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1

Citation Types

0
3
0

Year Published

2020
2020
2021
2021

Publication Types

Select...
3

Relationship

0
3

Authors

Journals

citations
Cited by 3 publications
(3 citation statements)
references
References 37 publications
0
3
0
Order By: Relevance
“…As a result, we can be confident that the molecules within the thin film are predominantly oriented with the c crystallographic axis along the surface normal (Figure b). In this particular case, the annealed samples show no obvious sign of surface-induced phases (SIP) or polymorphism . The d hkl spacings of 14.25 and 7.12 Å from the GIXRD experiment match those from the unit cell data (14.28 and 7.14 Å for the d (002) and d (004) planes, respectively).…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…As a result, we can be confident that the molecules within the thin film are predominantly oriented with the c crystallographic axis along the surface normal (Figure b). In this particular case, the annealed samples show no obvious sign of surface-induced phases (SIP) or polymorphism . The d hkl spacings of 14.25 and 7.12 Å from the GIXRD experiment match those from the unit cell data (14.28 and 7.14 Å for the d (002) and d (004) planes, respectively).…”
Section: Resultsmentioning
confidence: 99%
“…In this particular case, the annealed samples show no obvious sign of surface-induced phases (SIP) or polymorphism. 33 The d hkl spacings of 14.25 and 7.12 Å from the GIXRD experiment match those from the unit cell data (14.28 and 7.14 Å for the d(002) and d(004) planes, respectively). The upright orientation adopted by TPBi, with the (001) plane (a−b face) exposed at the surface (Figure 3b), can be rationalized via intermolecular forces and surface energy considerations.…”
Section: Methodsmentioning
confidence: 99%
“…[38] According to the previous literature, we have made proper background corrections. [39,40] The GIWAXS patterns for PM6:ITC6-4Cl blend films evolve with increased DR8 contents (Figure 5a), with those for neat films of ITC6-4Cl and DR8 presented in Figure S13 in the Supporting Information. The corresponding scattering profiles in the out-of-plane (OOP) and in-plane (IP) directions are shown in Figure 5b for both binary and ternary blend films.…”
Section: Morphology Studiesmentioning
confidence: 99%