“…Over the last years, numerous of Ga 2 O 3 -based solar blind photodetectors have been demonstrated with different structures including original bulk, thin films, and even nanostructures. − , Among these, β-Ga 2 O 3 thin film solar-blind photodetectors have grabbed much research interests in practical applications due to their easy growth, low cost, and better repeatability. − As we all know, an ideal efficient solar-blind photodetector should have the following properties including high signal current-to-dark ratio, high sensitivity, high spectral selectivity, high speed, high stability, and low fabrication cost. ,, In addition, ultralow dark current is often required for a high-performance photodetector, which means that the semiconductor materials used should have high resistance. For β-Ga 2 O 3 , due to its n-type feature with self-compensation for oxygen defects, one effective way to obtain high-resistance and high insulating Ga 2 O 3 thin films is to produce high-quality, defect-free β-Ga 2 O 3 single crystal films without oxygen vacancies. ,, Until now, β-Ga 2 O 3 thin film on other substrates has been widely reported by different growth techniques such as thermal evaporation, radio frequency magnetron sputtering, , chemical vapor deposition, pulsed laser deposition, molecular beam epitaxy, , metal–organic chemical vapor deposition, , microwave irradiation approach, atomic layer deposition, , and mechanical exfoliation method . However, limited by the large lattice mismatch, the above traditional heteroepitaxial growth method cannot meet the requirements for preparing CMOS-compatible, high-quality silicon-based β-Ga 2 O 3 thin films at a large scale.…”