Structural and optical characteristics of transparent conducting yttrium doped ZnO films using screen printing technology

Structural, optical, and magnetic properties of KBiFe2O5 synthesized by a sol‐gel method using PVP as additive

“…The samples were characterized via wide‐angle X‐ray diffraction (XRD) using a Bruker X‐ray diffractometer model D8 Advance ECO (Cu Kα radiation, wavelength λ = 0.15406 nm and scanning rate of 2.0°/min); the results were compared with a powder diffraction pattern simulated using the VESTA software 23 for monoclinic and orthorhombic phases (more details at Table ). The crystallite size L was calculated by the Debye‐Scherrer equation (L = (k.λ)/(B.cosθ)) 24 where k is a dimensionless factor (usually equal to 0.9), B is the width of the diffraction peak (in rad) and θ is the position peak in the XRD. The morphological characterization was carried out through scanning electron microscopy (SEM) using a Philip XL‐30 TMP microscope.…”

“…Diffuse reflectance measurements (R∞) can be converted into a magnitude proportional to the absorption by applying the Kubelka‐Munk function represented by F(R ∞ ) = [1 − (R ∞ )] 2 /(2R ∞ ) 24‐26 . From this function, it is possible to obtain the band gap of the material using a Tauc plot that consists of plotting the square (direct band gap) or the square root (indirect band gap) of the function [F(R∞)(ℎ v )] 2 vs the excitation energy of the emitted photon (ℎ v ), where ℎ is the Planck's constant and v is the frequency.…”

Investigation on the structural and optical properties of Zn1-xCuxO (x=0, 0.05, 0.1) sintered thick films for optoelectronic device applications

“…33 Moreover, the appearance of a sharp peak at 441 cm -1 reflects the presence of induced stress in ZnO wurtzite crystal structure. -1 phonon modes due to the confinement of optical phonons 35,36 in nano-sized samples.…”