2006
DOI: 10.1016/j.tsf.2005.12.269
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Structural and morphological properties of ZnO:Ga thin films

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Cited by 111 publications
(63 citation statements)
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“…This manifest there has been tensile stress in the plane of the films as compared with unstressed powder. This may be mainly due to the radius of Ga 3+ (0.062 nm) is smaller than that of Zn 2+ (0.074 nm) [9,10], The replacement of Zn 2+ with Ga 3+ caused the decrease of the c-axis lattice parameter, which may result in the increase of the diffraction angle. What's more, there is a fluctuation of diffraction angle as substrate temperature increases.…”
Section: Methodsmentioning
confidence: 99%
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“…This manifest there has been tensile stress in the plane of the films as compared with unstressed powder. This may be mainly due to the radius of Ga 3+ (0.062 nm) is smaller than that of Zn 2+ (0.074 nm) [9,10], The replacement of Zn 2+ with Ga 3+ caused the decrease of the c-axis lattice parameter, which may result in the increase of the diffraction angle. What's more, there is a fluctuation of diffraction angle as substrate temperature increases.…”
Section: Methodsmentioning
confidence: 99%
“…The amount of Ga 2 O 3 added to the target was 10 wt. % [10]. The size of the target was 250 mm and 80 mm in length and width separately.…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…Other types of the texture control were recently reported, such as, epitaxial growth on a specific substrate, sample position (141), precursor flux control, substrate tilting and using an external oxygen ion source to control the oxygen ion bombardment during growth (118,142,143 ). Earlier, we demonstrated the change of the texture of the ZnO films from (0001) to (10-11) via Ga doping and the morphology control via respective annealing (144,145). We have recently reported on the control of ZnO nanostructure location and inclination via respective substrate miss cut in the epitaxial growth of ZnO on 4H-SiC (13).…”
Section: Recent Achievements In Zno Nanocrystal Based Biosensorsmentioning
confidence: 87%
“…It has successfully being used in MOCVD growth process to grow aligned hexagonal nanorods and whiskers, nanotube arrays and thin films at temperature range 500 -650 °C on various substrates [20]. Earlier, we have reported successful growth of pure ZnO and Ga doped films even at lower substrate growth temperatures (T = 250 °C) by PEMOCVD [21,22]. It was concluded that the plasma discharge promotes the precursors decomposition and increases the ZnO adatoms mobility, resulting in high quality film formation [23] at lowered temperatures.…”
Section: Precursors Chemistrymentioning
confidence: 99%