2001
DOI: 10.1063/1.1378800
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Structural and magnetic properties of η-phase manganese nitride films grown by molecular-beam epitaxy

Abstract: Face-centered tetragonal (fct) η-phase manganese nitride films have been grown on magnesium oxide (001) substrates by molecular-beam epitaxy. For growth conditions described here, reflection high energy electron diffraction and neutron scattering show primarily two types of domains rotated by 90° to each other with their c axes in the surface plane. Scanning tunneling microscopy images reveal surface domains consisting of row structures which correspond directly to the bulk domains. Neutron diffraction data co… Show more

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Cited by 78 publications
(67 citation statements)
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“…8 The RHEED pattern of the Mn 3 N 2 film is streaky, indicating epitaxial growth. 7,8 Following growth, the samples are investigated with in situ STM. For normal STM studies, we use electrochemically etched tungsten tips which are cleaned in the ultra high vacuum chamber using electron bombardment.…”
Section: Methodsmentioning
confidence: 99%
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“…8 The RHEED pattern of the Mn 3 N 2 film is streaky, indicating epitaxial growth. 7,8 Following growth, the samples are investigated with in situ STM. For normal STM studies, we use electrochemically etched tungsten tips which are cleaned in the ultra high vacuum chamber using electron bombardment.…”
Section: Methodsmentioning
confidence: 99%
“…The rows in the STM image cross over step edges without interruption or shift, indicating that the surface structure is directly correlated with the bulk structure. 7 We see that there are two domains labeled by η-D1 and η-D2, respectively. Since the substrate [MgO(001)] has 4-fold symmetry, we expect equal quantities of both types of domains, and numerous domain boundaries (DBs) are commonly observed, as indicated by 'DB' in Fig.…”
Section: A Surface Domain Structurementioning
confidence: 99%
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“…While much research has been dedicated to the analysis of bulk antiferromagnets, wide-angle neutron diffraction has recently been used to characterize antiferromagnetic films with thicknesses on the order of 30-500 nm. [30,31,32] Microscopy (optical, electron and X-ray) techniques typically resolve local realspace variations in magnetic structure and complement capabilities of statistical probes such as, neutron (and other) scattering techniques, which measure an ensemble average of magnetic structure. Magnetic microscopy techniques such as magnetic force and scanning electron with polarization analysis microscopies have excellent sensitivity to magnetic domain structure.…”
Section: Neutron Scattering and Complementary Techniquesmentioning
confidence: 99%