2008
DOI: 10.1016/j.spmi.2008.05.004
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Structural and electronic properties of GaAsBi

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Cited by 24 publications
(7 citation statements)
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“…The ω-2θ X-ray diffraction (XRD) measurements throughout this work were taken on a Bruker D8 Discover XRD machine using Cu kα 1 radiation and the measured diffraction patterns were modelled using RADS Mercury software assuming a GaBi lattice constant of 6.28 Å [11].…”
Section: Methodsmentioning
confidence: 99%
“…The ω-2θ X-ray diffraction (XRD) measurements throughout this work were taken on a Bruker D8 Discover XRD machine using Cu kα 1 radiation and the measured diffraction patterns were modelled using RADS Mercury software assuming a GaBi lattice constant of 6.28 Å [11].…”
Section: Methodsmentioning
confidence: 99%
“…Achour et al [86] have investigated structural and electronic properties of GaAs 1−x Bi x alloys and (GaAs) m /(GaBi) n superlattices (SLs) using full potential linear augmented plane wave (FPLAPW) method as implemented in the LmtART code and the full potential linear muffin-tin orbital (FPLMTO) method as implemented in the WIEN97 code. In both cases, they are possibly semiconductors when the proportion of GaBi is no more than that of GaAs and the semi-metallic property appears if the proportion of GaAs is lower.…”
Section: Nanostructuresmentioning
confidence: 99%
“…Regarding the DFT calculations, it is well known that it is a very powerful tool when studying the band structure of semiconductor alloys including HMAs [24]. So far this approach has been applied several times to study III-V-Bi alloys by other authors [25][26][27] but the issue of Bi-induced changes in the CB and VB as well as the issue of band offsets between III-V host and III-V-Bi alloys have not been systematically analyzed. This paper addresses these issues in a consistent and systematic way.…”
Section: Introductionmentioning
confidence: 99%