2011
DOI: 10.1063/1.3606094
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Structural and Electrical Studies of Cd1−xZnxTe Thin Film by Vacuum Evaporation Technique

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Cited by 9 publications
(8 citation statements)
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“…In high frequency region both dielectric constant and dielectric loss are fairly remaining constant. The high dielectric constant at low frequency is due to the existence of different types of polarization mechanisms like electronic, ionic, orientation and space-charge polarization [29][30][31]. Due to the interfaces with a large volume fraction with assisted surfactant, two kinds of polarization (spacecharge and rotation direction polarization) occur in SnSe 2 nanoparticles.…”
Section: Dielectric Studiesmentioning
confidence: 98%
“…In high frequency region both dielectric constant and dielectric loss are fairly remaining constant. The high dielectric constant at low frequency is due to the existence of different types of polarization mechanisms like electronic, ionic, orientation and space-charge polarization [29][30][31]. Due to the interfaces with a large volume fraction with assisted surfactant, two kinds of polarization (spacecharge and rotation direction polarization) occur in SnSe 2 nanoparticles.…”
Section: Dielectric Studiesmentioning
confidence: 98%
“…The fundamental absorption edge in most amorphous semiconductors follows the exponential law. In the high absorption region (α ≥ 104 cm − 1 ), the photon energy dependence of the absorption coefficient can be described by the quadratic relation [5] …”
Section: Optical Propertiesmentioning
confidence: 99%
“…This class of material containing a large percentage of chalcogen element is widely used in switching and memory devices [2,3]. An understanding of the dependence of various properties of such chalcogenide glasses on composition is of considerable importance [4,5]. The optical properties of amorphous semiconductors have been the subject of many recent papers [6,7].…”
Section: Introductionmentioning
confidence: 99%
“…3. It is worth mentioning here that the particle size directly influences the grain size in the deposited films, as governed by the Brus equation [24].…”
Section: Cis Nano-particle Synthesismentioning
confidence: 99%