2021
DOI: 10.1007/s00339-020-04243-5
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Structural and electrical properties of sol–gel grown nanostructured ZnO and LaMnO3 particle-based nanocomposites

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Cited by 11 publications
(3 citation statements)
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“…Figure 10 demonstrates the log frequency-dependent the real part (M') and the imaginary part (M'') of 0%TC, 2%TC, 4%TC and 6%TC samples. The real part (M 0 ) has nearly zero value in the low frequency region, indicating a negligible influence from electrodes [65]. At higher frequency, the real part (M 0 ) of the complex modulus increases throughout the frequency range used.…”
Section: Electrical Modulus Analysismentioning
confidence: 98%
“…Figure 10 demonstrates the log frequency-dependent the real part (M') and the imaginary part (M'') of 0%TC, 2%TC, 4%TC and 6%TC samples. The real part (M 0 ) has nearly zero value in the low frequency region, indicating a negligible influence from electrodes [65]. At higher frequency, the real part (M 0 ) of the complex modulus increases throughout the frequency range used.…”
Section: Electrical Modulus Analysismentioning
confidence: 98%
“…The ZnO thin films can be easily nanostructured by different techniques like magnetron sputtering, [ 11 ] thermal evaporation, [ 12 ] sol‐gel, [ 13 ] chemical vapor deposition (CVD), [ 14 ] hydrothermal, [ 15 ] and spray pyrolysis technique, used in this work due to its simplicity, low cost and non‐vacuum deposition method allowing the reproducibility of reliable and uniform films of metal, oxide, and semiconductor. [ 16 ]…”
Section: Introductionmentioning
confidence: 99%
“…[8] However, recombination can be relatively avoided by separating, trapping, and transferring charges to intermediate energy levels as structural and surface defects. [9,10] The ZnO thin films can be easily nanostructured by different techniques like magnetron sputtering, [11] thermal evaporation, [12] sol-gel, [13] chemical vapor deposition (CVD), [14] hydrothermal, [15] and spray pyrolysis technique, used in this work due to its simplicity, low cost and non-vacuum deposition method allowing the reproducibility of reliable and uniform films of metal, oxide, and semiconductor. [16] In this study, the modification of physical properties by varying the deposition temperature was targeted to enhance the photodegradation efficiency.…”
Section: Introductionmentioning
confidence: 99%