2008
DOI: 10.1063/1.2827451
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Structural analysis of life tested 1.3 μm quantum dot lasers

Abstract: Articles you may be interested inNegative characteristic temperature of long wavelength In As ∕ Al Ga In As quantum dot lasers grown on InP substrates Appl. Phys. Lett. 91, 261105 (2007); 10.1063/1.2827177 Over 1.3 μ m continuous-wave laser emission from InGaSb quantum-dot laser diode fabricated on GaAs substrates Appl. Phys. Lett. 86, 203118 (2005); 10.1063/1.1931046Long-wavelength laser based on self-assembled InAs quantum dots in InAlGaAs on InP (001) We present the results of an accelerated life test study… Show more

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Cited by 46 publications
(16 citation statements)
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“…As shown in Figure 1b and c, a Figure 1b and c also reveal that the threading dislocation can be either pinned or propelled away from QDs. Therefore, the strong strain field of a QD array also prevents the in-plane motion of dislocations, and therefore superior reliability is expected from QD lasers compared with QW or bulk devices, even in the presence of high-density dislocations 22,23 .These unique properties of QDs provide a promising route towards monolithic III-V on silicon (III-V/Si) integration. As shown in Figure 1a, III-V QD lasers grown on silicon are rapidly approaching the performance of those grown on native GaAs substrates 24,25 .…”
mentioning
confidence: 99%
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“…As shown in Figure 1b and c, a Figure 1b and c also reveal that the threading dislocation can be either pinned or propelled away from QDs. Therefore, the strong strain field of a QD array also prevents the in-plane motion of dislocations, and therefore superior reliability is expected from QD lasers compared with QW or bulk devices, even in the presence of high-density dislocations 22,23 .These unique properties of QDs provide a promising route towards monolithic III-V on silicon (III-V/Si) integration. As shown in Figure 1a, III-V QD lasers grown on silicon are rapidly approaching the performance of those grown on native GaAs substrates 24,25 .…”
mentioning
confidence: 99%
“…As shown in Figure 1b and c, a Figure 1b and c also reveal that the threading dislocation can be either pinned or propelled away from QDs. Therefore, the strong strain field of a QD array also prevents the in-plane motion of dislocations, and therefore superior reliability is expected from QD lasers compared with QW or bulk devices, even in the presence of high-density dislocations 22,23 .…”
mentioning
confidence: 99%
“…QD arrays can also prevent dislocation movement because of the strong strain field. In the case of a high‐density nonradiative composite center, QD lasers still have a longer lifetime and higher reliability than those of QW devices …”
Section: Qd Lasermentioning
confidence: 99%
“…These differences between III-V and Group IV materials tend to produce various types of defects-APBs, threading dislocations (TDs), and microcracks-which all generate nonradiative recombination centers and dramatically undermine the promise of III-V materials [28]. Over the last two decades, III-V QD light sources, including LDs and SLDs, have been demonstrated with much lower threshold current density [29]- [31] and significantly reduced temperature sensitivity [32] than III-V quantum well (QW) devices due to their delta-function-like density of states [33], [34]. Also, the superiority of QD structures for achieving broad bandwidth in SLDs is well established owing to their naturally large size inhomogeneity when grown by the S-K growth mode [35].…”
Section: Introductionmentioning
confidence: 99%