2017
DOI: 10.1109/jstqe.2017.2693025
|View full text |Cite
|
Sign up to set email alerts
|

Monolithically Integrated Electrically Pumped Continuous-Wave III-V Quantum Dot Light Sources on Silicon

Abstract: In this paper, we report monolithically integrated III-V quantum dot (QD) light-emitting sources on silicon substrates for silicon photonics. We describe the first practical InAs/GaAs QD lasers monolithically grown on an offcut silicon (001) substrate due to the realization of high quality III-V epilayers on silicon with low defect density, indicating that the large material dissimilarity between III-Vs and silicon is no longer a fundamental barrier limiting monolithic growth of III-V lasers on Si substrates. … Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
14
0

Year Published

2017
2017
2021
2021

Publication Types

Select...
6
2
2

Relationship

3
7

Authors

Journals

citations
Cited by 28 publications
(14 citation statements)
references
References 65 publications
(70 reference statements)
0
14
0
Order By: Relevance
“…1(a). The III-V on silicon structures employed here eliminate the utilization of either patterned Si substrates that require nanopattern lithography and etching processes [13], or specialized offcut Si wafers not commonly used in CMOS fabs and cost-intensive [14]. Our developed InP-on-Si (IoS) template technology can ease the transfer of incumbent InP-based optoelectronic devices and PIC technologies onto the advanced Si manufacturing platform [15][16][17][18], contributing to future dense optoelectronic integration and high speed data communications.…”
Section: Experimental Methodsmentioning
confidence: 99%
“…1(a). The III-V on silicon structures employed here eliminate the utilization of either patterned Si substrates that require nanopattern lithography and etching processes [13], or specialized offcut Si wafers not commonly used in CMOS fabs and cost-intensive [14]. Our developed InP-on-Si (IoS) template technology can ease the transfer of incumbent InP-based optoelectronic devices and PIC technologies onto the advanced Si manufacturing platform [15][16][17][18], contributing to future dense optoelectronic integration and high speed data communications.…”
Section: Experimental Methodsmentioning
confidence: 99%
“…The growth details of the InAs/InGaAs dot-in-well (DWELL) structure monolithically grown on Si substrates have been shown by Wang et al 21,22 The schematic sample structure and crosssection bright field scanning transmission electron microscopy (BF-STEM) image of the as-grown sample are shown in Figs. 1(a) and 1(b), respectively.…”
Section: A Sample Growthmentioning
confidence: 99%
“…Lasing characteristics for silicon-based lasers with FIB-created facets and as-cleaved facets were compared, and the initial results reveal that there was no obvious deterioration between these two facet realization approaches. Various Si-based light emitting sources, such as lasers, superluminescent diodes (SLDs) [11] and LEDs, were then realized by effectively reduced facet reflectivity using focused Ga+ ion beam milling of the front facet of the edge emitting Si-based InAs/GaAs QD laser [12].…”
Section: 3 µM Qd Lasers Grown On Si Substratesmentioning
confidence: 99%