2000
DOI: 10.1109/84.896761
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Stroboscopic interferometer system for dynamic MEMS characterization

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Cited by 133 publications
(80 citation statements)
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“…The surface profile of the DM is reconstructed using five interferograms collected at four distinct phase shifts (0, /2, , 3 /2) using Hariharan's algorithm [16]. The use of a similar instrument for dynamic characterization of millimeter-sized MEMS devices was first described by Hart et al [17]. The instrument is capable of measuring the surface profile with an RMS accuracy of approximately 6 nm and an absolute accuracy of ±60 nm across a 10 mm pupil.…”
Section: Phase-shifting Interferometermentioning
confidence: 99%
“…The surface profile of the DM is reconstructed using five interferograms collected at four distinct phase shifts (0, /2, , 3 /2) using Hariharan's algorithm [16]. The use of a similar instrument for dynamic characterization of millimeter-sized MEMS devices was first described by Hart et al [17]. The instrument is capable of measuring the surface profile with an RMS accuracy of approximately 6 nm and an absolute accuracy of ±60 nm across a 10 mm pupil.…”
Section: Phase-shifting Interferometermentioning
confidence: 99%
“…The DM is placed in the test path of a Twyman-Green interferometer composed of a polarizing beam splitter (PBS), two quarter-wave plates (QWP), and a flat reference mirror (RM), as illustrated in Figure 2 [31,32]. The interferometer light source is a fiber-coupled 635-nm laser diode (Hitachi HL6320G), which is expanded and collimated to a 25 mm diameter using two lenses.…”
Section: Apparatusmentioning
confidence: 99%
“…The electrodes on the back face of the DM consist of a central pad surrounded by four annular rings of electrodes. The central pad and the electrodes in the two inner rings (channels 1-19) are used to generate local curvature in the mirror surface, while the electrodes in the outer ring (channels [20][21][22][23][24][25][26][27][28][29][30][31][32][33][34][35] produce a slope at the edge of the DM. The curvature and slope electrodes are separated by the third annular electrode ring identified as the guard ring.…”
Section: Characteristics Of the Aoptix Dmmentioning
confidence: 99%
“…The surface profile of the DM is reconstructed using five interferograms collected at four distinct phase shifts (0, π/2, π, 3π/2) using Hariharan's algorithm [12]. The use of a similar instrument for dynamic characterization of millimeter-sized MEMS devices was first described by Hart, et al [13]. A previous incarnation of this instrument employed continuous-wave illumination, allowing static surface profiles to be measured [5].…”
Section: Experimental Apparatusmentioning
confidence: 99%