2011
DOI: 10.1039/c1jm11164g
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Strategies for controlling Si nanowire formation during Au-assisted electroless etching

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Cited by 37 publications
(39 citation statements)
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References 30 publications
(63 reference statements)
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“…Porosity of the Si NWs was found to be greater at the tip, which resulted in bending of the Si NWs [94,95].…”
Section: Influence Of Doping Density On the Formation Of Mac-etched Smentioning
confidence: 96%
See 1 more Smart Citation
“…Porosity of the Si NWs was found to be greater at the tip, which resulted in bending of the Si NWs [94,95].…”
Section: Influence Of Doping Density On the Formation Of Mac-etched Smentioning
confidence: 96%
“…When bulk Si is fully lithiated to Li 15 Si 4 , it undergoes a volume expansion of 280% and has a maximum theoretical volumetric capacity of 2,190 mAh·cm -3 . Unfortunately, Si electrodes pulverize as a result of the large expansion and contraction upon Li insertion and extraction and this causes the electrode material to lose contact with the current collector, lower its conductivity, and result in a loss of capacity with cycling [71,95,133,[143][144][145][146][147][148]. Several Si structures have been investigated as viable anodes for LIBs, including Si thin films [149,150] and Si powder [151,152].…”
Section: Si Anodes For Li-ion Batteriesmentioning
confidence: 99%
“…New structures such as a 'bamboo shoot' like pattern could also be established with simple adjustment of parameters. More importantly, we have found through detailed in situ investigation that the formation of inclination and clustering in this process is likely not through the normally considered 'bending' model [25], but rather due to a preferential lateral movement of reaction fronts (accompanied by subsequent motion of silver particles) at the bottom of the Si wires (here 'lateral' refers to the direction parallel to the surface of the substrate while conventional 'vertical' etching is perpendicular to the surface). Evidently, significant mass transport of the Ag results and can be detected by energy-dispersive x-ray spectroscopy (EDX) measurement on the surface of the Si substrate.…”
Section: Introductionmentioning
confidence: 88%
“…We should point out that most of the primary reports on rough NWs as thermoelectric materials have been MACetched vapor-liquid-solid (VLS) grown NWs, and so are intrinsically doped. [25][26][27][28] In our case, we create a layer of NWs directly from a Si(100) wafer coupon.…”
Section: Methodsmentioning
confidence: 99%